Search Results - "Lou, Zaiqi" :: K.UTB vyhledávací portál

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Unclamped Inductive Switching Robustness of SiC Devices With Parallel-Connected Varistor

by Saito, Wataru, Lou, Zaiqi, NIshizawa, Shin-Ichi
Published in IEEE transactions on electron devices (01.10.2022)

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Investigation of acceptable breakdown voltage variation for parallel-connected SiC MOSFETs during unclamped inductive switching test

by Lou, Zaiqi, Saito, Wataru, Nishizawa, Shin-ichi
Published in Japanese Journal of Applied Physics (01.05.2021)

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Estimating of IGBT Bond Wire Lift-Off Trend Using Convolutional Neural Network (CNN)

by Mamee, Thatree, Lou, Zaiqi, Hata, Katsuhiro, Takamiya, Makoto, Sakurai, Takayasu, Nishizawa, Shin-Ichi, Saito, Wataru
Published in IEEE access (2024)

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IGBT Power Module Design for Suppressing Gate Voltage Spike at Digital Gate Control

by Lou, Zaiqi, Mamee, Thatree, Hata, Katsuhiro, Takamiya, Makoto, Nishizawa, Shin-Ichi, Saito, Wataru
Published in IEEE access (2023)

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Mechanism of gate voltage spike under digital gate control at IGBT switching operations

by Lou, Zaiqi, Mamee, Thatree, Hata, Katsuhiro, Takamiya, Makoto, Nishizawa, Shin-ichi, Saito, Wataru
Published in Power electronic devices and components (01.04.2024)

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Bond wire lift-off detection by gate voltage waveform in IGBT turn-off process enhanced by digital gate control

by Mamee, Thatree, Lou, Zaiqi, Hata, Katsuhiro, Takamiya, Makoto, Nishizawa, Shin-ichi, Saito, Wataru
Published in Power electronic devices and components (01.10.2023)

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Application of N parallel-connected SiC MOSFETs to solid-state circuit breakers based on UIS tests

by Lou, Zaiqi, Saito, Wataru, Nishizawa, Shin-ichi
Published in Microelectronics and reliability (01.11.2022)

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Enhancement of turn-off gate voltage waveform change by digital gate control for bond wire lift-off detection in IGBT module

by Mamee, Thatree, Lou, Zaiqi, Hata, Katsuhiro, Takamiya, Makoto, Nishizawa, Shin-ichi, Saito, Wataru
Published in Microelectronics and reliability (01.08.2023)

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Investigations on acceptable breakdown voltage variation of parallel-connected SiC MOSFETs applied to olid-state circuit breakers

by Lou, Zaiqi, Wada, Keiji, Saito, Wataru, Nishizawa, Shin-ichi
Published in Microelectronics and reliability (01.11.2021)

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Cutoff Current Capability of SiC-MOSFETs with Parallel Connected Varistor under UIS Condition

by Saito, Wataru, Lou, Zaiqi, Nishizawa, Shin-ichi
Published in 2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe (WiPDA Europe) (18.09.2022)

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