Reliability investigations and improvements of the pLEDMOS for PDP data driver ICs
Qian, Qinsong, Sun, Weifeng, Li, Haisong, Wu, Hong, Shi, Longxing
Published in Semiconductor science and technology (11.05.2011)
Published in Semiconductor science and technology (11.05.2011)
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Journal Article
A Data Prefetch and Reuse Strategy for Coarse-Grained Reconfigurable Architectures
GE, Wei, QI, Zhi, DU, Yue, MA, Lu, SHI, Longxing
Published in IEICE Transactions on Information and Systems (2013)
Published in IEICE Transactions on Information and Systems (2013)
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Journal Article
All-Digital Wide Range Precharge Logic 50% Duty Cycle Corrector
Gu, Junhui, Wu, Jianhui, Gu, Danhong, Zhang, Meng, Shi, Longxing
Published in IEEE transactions on very large scale integration (VLSI) systems (01.04.2012)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.04.2012)
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Journal Article
A Novel Latch-Up Protection for Bulk-Silicon Scan Driver ICs of Shadow-Mask Plasma-Display Panel
Sun, Weifeng, Yi, Yangbo, Li, Haisong, Shi, Longxing
Published in IEEE electron device letters (01.12.2007)
Published in IEEE electron device letters (01.12.2007)
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Journal Article
Trench superjunction VDMOS with charge imbalance cells
Sun, Weifeng, Zhu, Jing, Qian, Qingsong, Cao, Pengfei, Liu, Siyang, Su, Zhan, Lu, Shengli, Shi, Longxing
Published in Solid-state electronics (01.10.2011)
Published in Solid-state electronics (01.10.2011)
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Journal Article
A side-channel analysis resistant reconfigurable cryptographic coprocessor supporting multiple block cipher algorithms
Weiwei Shan, Longxing Shi, Xingyuan Fu, Xiao Zhang, Chaoxuan Tian, Zhipeng Xu, Jun Yang, Jie Li
Published in 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC) (01.06.2014)
Published in 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC) (01.06.2014)
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Conference Proceeding
A sub-circuit MOSFET model with a wide temperature range including cryogenic temperature
Jia, Kan (伲贾), Sun, Weifeng (伟锋 孙), Shi, Longxing (龙兴 时)
Published in Journal of semiconductors (01.06.2011)
Published in Journal of semiconductors (01.06.2011)
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Journal Article
A digital prediction algorithm for a single-phase boost PFC
Wang, Qing, Chen, Ning, Sun, Weifeng, Lu, Shengli, Shi, Longxing
Published in Journal of semiconductors (01.12.2012)
Published in Journal of semiconductors (01.12.2012)
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Journal Article
An adaptive energy-efficient and low-latency MAC protocol for wireless sensor networks
Liu, Hao, Yao, Guoliang, Wu, Jianhui, Shi, Longxing
Published in Journal of communications and networks (01.10.2010)
Published in Journal of communications and networks (01.10.2010)
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Journal Article
Devices’ optimization against hot-carrier degradation in high voltage pLEDMOS transistor
Wu, Hong, Qian, Qinsong, Liu, Siyang, Sun, Weifeng, Shi, Longxing
Published in Microelectronics and reliability (01.08.2010)
Published in Microelectronics and reliability (01.08.2010)
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Journal Article
The degradation mechanisms in high voltage pLEDMOS transistor with thick gate oxide
Wu, Hong, Sun, Weifeng, Yi, Yangbo, Li, Haisong, Shi, Longxing
Published in Microelectronics and reliability (01.11.2008)
Published in Microelectronics and reliability (01.11.2008)
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Journal Article
A 65nm 10MHz single-inductor dual-output switching buck converter with time-multiplexing control
Miao Yang, Weifeng Sun, Shen Xu, Shengli Lu, Longxing Shi
Published in 2011 9th IEEE International Conference on ASIC (01.10.2011)
Published in 2011 9th IEEE International Conference on ASIC (01.10.2011)
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Conference Proceeding
Research into charge pumping method technique for hot-carrier degradation measurement of LDMOS
Qinsong, Qian, Siyang, Liu, Weifeng, Sun, Longxing, Shi
Published in Journal of semiconductors (01.10.2009)
Published in Journal of semiconductors (01.10.2009)
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Journal Article
Low power design for SoC with power management unit
Daying Sun, Shen Xu, Weifeng Sun, Shengli Lu, Longxing Shi
Published in 2011 9th IEEE International Conference on ASIC (01.10.2011)
Published in 2011 9th IEEE International Conference on ASIC (01.10.2011)
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Conference Proceeding
Linear drain current degradations of FG-pLEDMOS transistor under different AC stress conditions
Qinsong Qian, Weifeng Sun, Siyang Liu, Longxing Shi, Wei Su, Zhengxin Xu, Shulang Ma
Published in 2012 24th International Symposium on Power Semiconductor Devices and ICs (01.06.2012)
Published in 2012 24th International Symposium on Power Semiconductor Devices and ICs (01.06.2012)
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Conference Proceeding
A 510-nW Wake-Up Keyword-Spotting Chip Using Serial-FFT-Based MFCC and Binarized Depthwise Separable CNN in 28-nm CMOS
Shan, Weiwei, Yang, Minhao, Wang, Tao, Lu, Yicheng, Cai, Hao, Zhu, Lixuan, Xu, Jiaming, Wu, Chengjun, Shi, Longxing, Yang, Jun
Published in IEEE journal of solid-state circuits (01.01.2021)
Published in IEEE journal of solid-state circuits (01.01.2021)
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Journal Article