Structural measurement of electron-phonon coupling and electronic thermal transport across a metal-semiconductor interface
Jo, Wonhyuk, Kee, Jungyun, Kim, Kooktea, Landahl, Eric C., Longbons, Grace, Walko, Donald A., Wen, Haidan, Lee, Dong Ryeol, Lee, Sooheyong
Published in Scientific reports (05.10.2022)
Published in Scientific reports (05.10.2022)
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