Application of a bespoke monoclonal antibody panel to characterize immune cell populations in cave nectar bats
Chen, Shiwei, Sia, Wan Rong, Tang, Leon J.W., Gamage, Akshamal M., Chan, Wharton O.Y., Zhu, Feng, Chia, Wanni, Kwek, Madeline S.S., Kong, Pui San, Lim, Beng Lee, Foo, Randy, Ng, Wei Lun, Tan, Adrian H.J., He, Shan, Loh, Abigail Y.T., Low, Dolyce H.W., Smith, Gavin J.D., Hong, Lewis Z., Wang, Lin-Fa
Published in Cell reports (Cambridge) (22.10.2024)
Published in Cell reports (Cambridge) (22.10.2024)
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Journal Article
Application of a bespoke monoclonal antibody panel to characterize immune cell populations in cave nectar bats
Chen, Shiwei, Sia, Wan Rong, Tang, Leon J.W., Gamage, Akshamal M., Chan, Wharton O.Y., Zhu, Feng, Chia, Wanni, Kwek, Madeline S.S., Kong, Pui San, Lim, Beng Lee, Foo, Randy, Ng, Wei Lun, Tan, Adrian H.J., He, Shan, Loh, Abigail Y.T., Low, Dolyce H.W., Smith, Gavin J.D., Hong, Lewis Z., Wang, Lin-Fa
Published in Cell reports (Cambridge) (24.09.2024)
Published in Cell reports (Cambridge) (24.09.2024)
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Journal Article
Huriez syndrome caused by a large deletion that abrogates the skin‐specific isoform of SMARCAD1
Loh, A.Y.T., Ho, C.M., Muthiah, S., Venkatesh, B., Zwolinski, S., Bray, A.P.J.J., Reversade, B., Rajan, N., Carney, T.J.
Published in British journal of dermatology (1951) (01.06.2021)
Published in British journal of dermatology (1951) (01.06.2021)
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Journal Article
Huriez syndrome: Additional pathogenic variants supporting allelism to SMARCAD syndrome
Loh, Abigail Y. T., Špoljar, Sanja, Neo, Granville Y. W., Escande‐Beillard, Nathalie, Leushacke, Marc, Luijten, Monique N. H., Venkatesh, Byrappa, Bonnard, Carine, Steensel, Maurice A. M., Hamm, Henning, Carmichael, Andrew, Rajan, Neil, Carney, Thomas J., Reversade, Bruno
Published in American journal of medical genetics. Part A (01.06.2022)
Published in American journal of medical genetics. Part A (01.06.2022)
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Journal Article
Soft breakdown enhanced hysteresis effects in ultra-thin oxide SOI nMOSFETs
Chen, M.C., Tsai, C.W., Gu, S.H., Tahui Wang, Lu, S.H., Lin, S.W., Yang, G.S., Chen, J.K., Chien, S.C., Loh, Y.T., Liu, F.T.
Published in 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) (2002)
Published in 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) (2002)
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Conference Proceeding
Cloning and characterization of two members of the Pto gene family: the Pto bacterial resistance gene and the Fen insecticide sensitivity gene
Martin, G, Brommonschenkel, S, Chunwongse, J, Frary, A, Ganal, M, Jia, Y, Lindell, J, Loh, Y.T, Spivey, R, Thilmony, R
Published in Current plant science and biotechnology in agriculture (1994)
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Published in Current plant science and biotechnology in agriculture (1994)
Journal Article
Speed, power, and yield comparison of thin bonded SOI versus bulk CMOS technologies
Nowak, E.D., Ding, L., Loh, Y.T., Hu, C.
Published in Proceedings. IEEE International SOI Conference (1994)
Published in Proceedings. IEEE International SOI Conference (1994)
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Conference Proceeding
Thin bonded wafer SOI CMOS technology for low voltage high performance applications
Nowak, E.D., Ding, L., Loh, Y.T., Hu, C.
Published in International Electron Devices and Materials Symposium (1994)
Published in International Electron Devices and Materials Symposium (1994)
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Conference Proceeding
Performance of 70 nm strained-silicon CMOS devices
Hwang, J.R., Ho, J.H., Ting, S.M., Chen, T.P., Hsieh, Y.S., Huang, C.C., Chiang, Y.Y., Lee, H.K., Ariel Liu, Shen, T.M., Braithwaite, G., Currie, M., Gerrish, N., Hammond, R., Lochtefeld, A., Singaporewala, F., Bulsara, M., Xiang, Q., Lin, M.R., Shiau, W.T., Loh, Y.T., Chen, J.K., Chien, S.C., Wen, F.
Published in 2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407) (2003)
Published in 2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407) (2003)
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Conference Proceeding
Extending the reliability scaling limit of gate dielectrics through remote plasma nitridation of N/sub 2/O-grown oxides and NO RTA treatment
Liu, C.H., Hsiu-Shan Lin, Yu-Yin Lin, Chen, M.G., Pan, T.M., Kao, C.J., Huang, K.T., Lin, S.H., Sheng, Y.C., Wen-Tung Chang, Lee, J.H., Huang, M., Chiung-Sheng Hsiung, Huang-Lu, S., Chen-Chung Hsu, Liang, A.Y., Jenkon Chen, Hsieh, W.Y., Yen, P.W., Chien, S.C., Loh, Y.T., Chang, Y.J., Fu-Tai Liou
Published in 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) (2002)
Published in 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) (2002)
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Conference Proceeding