The analysis of evolutionary strategies to facilitate the transformation of traditional buildings into prefabricated buildings
Kong, Dewei, Zhang, Yu, Fan, Zhengshuo, Yang, Yanbo, Wang, Wei, Liu, Ping, He, Wei, Wong, C.J., Edmund Loh, W.M.
Published in Computers & industrial engineering (01.12.2024)
Published in Computers & industrial engineering (01.12.2024)
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Journal Article
Investigating the Impact of Gamma Radiation on Optical and Structural Properties of Malaysian and Sudanese Gum Arabic under Different Annealing Temperatures and Durations
Naeem, Hayder Salah, Ahmed, Naser M., Tabet, Tamer A., Wong, C.J., Loh, W.M. Edmund, Sulieman, A.
Published in NeuroQuantology (05.08.2020)
Published in NeuroQuantology (05.08.2020)
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Journal Article
An accurate method to extract specific contact resistivity using cross-bridge Kelvin resistors
Loh, W.M., Swirhun, S.E., Crabbe, E., Saraswat, K., Swanson, R.M.
Published in IEEE electron device letters (01.09.1985)
Published in IEEE electron device letters (01.09.1985)
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Journal Article
Low-resistance submicrometer contacts to silicon
Wright, P.J., Loh, W.M., Saraswat, K.C.
Published in IEEE transactions on electron devices (01.08.1988)
Published in IEEE transactions on electron devices (01.08.1988)
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Journal Article
A sum-over-paths impulse-response moment-extraction algorithm for RC IC-interconnect networks
Le Coz, Y.L., Krishna, D., Petranovic, D.M., Loh, W.M., Bendix, P.
Published in Solid-state electronics (01.12.2004)
Published in Solid-state electronics (01.12.2004)
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Journal Article
Modeling and measurement of contact resistances
Loh, W.M., Swirhun, S.E., Schreyer, T.A., Swanson, R.M., Saraswat, K.C.
Published in IEEE transactions on electron devices (01.03.1987)
Published in IEEE transactions on electron devices (01.03.1987)
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Journal Article
A Sum-over-Paths impulse-response moment-extraction algorithm for IC-interconnect networks: verification, coupled RC lines
Le Coz, Y.L., Krishna, D., Petranovic, D.M., Loh, W.M., Bendix, P.
Published in ICCAD-2003. International Conference on Computer Aided Design (IEEE Cat. No.03CH37486) (2003)
Published in ICCAD-2003. International Conference on Computer Aided Design (IEEE Cat. No.03CH37486) (2003)
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Conference Proceeding
The sidewall resistor-A novel test structure to reliably extract specific contact resistivity
Loh, W.M., Wright, P.J., Schreyer, T.A., Swirhun, S.E., Saraswat, K.C., Meindl, J.D.
Published in IEEE electron device letters (01.08.1986)
Published in IEEE electron device letters (01.08.1986)
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Journal Article