Four Keys to Managing Emergence
Ann Majchrzak, Dave Logan, Ron McCurdy, Mathias Kirchmer
Published in MIT Sloan management review (01.12.2006)
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Published in MIT Sloan management review (01.12.2006)
Journal Article
Analytic modeling of AC response to FET-level elements for CLY optimization
Karve, G., Logan, R., Greene, B., Winslow, J.
Published in 2012 SEMI Advanced Semiconductor Manufacturing Conference (01.05.2012)
Published in 2012 SEMI Advanced Semiconductor Manufacturing Conference (01.05.2012)
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Conference Proceeding
Standardised exhaled breath collection for the measurement of exhaled volatile organic compounds by proton transfer reaction mass spectrometry
Bikov, Andras, Paschalaki, Koralia, Logan-Sinclair, Ron, Horváth, Ildiko, Kharitonov, Sergei A, Barnes, Peter J, Usmani, Omar S, Paredi, Paolo
Published in BMC pulmonary medicine (09.07.2013)
Published in BMC pulmonary medicine (09.07.2013)
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Journal Article
Device-design metrics to improve manufacturability
Peterson, Kirk, Logan, Ron, Xiaojun Yu, Dezfulian, Kevin, Bazan, Greg, Winslow, Jon, Zamdmer, Noah, Dubuque, Lenny, Walsh, Brian, Norfleet, Andrew, Clougherty, Fran, Bayat, Ben, Mocuta, Anda, Rim, Ken
Published in 2010 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.07.2010)
Published in 2010 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.07.2010)
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Conference Proceeding
A 6.25 mW, +21 dBm OIP3, 0.85 dB NF, 2.5 GHz LNA Employing High Self Gain Device in 0.13 \mu \mathrm SOI Technology
Vanukuru, Venkata, Dutta, Anupam, Swaminathan, Balaji, Choppalli, Satyasuresh, Wolf, Randy, Jaffe, Mark, Tan, Yue, Logan, Ron, Monaghan, John Ellis, Joseph, Alvin
Published in 2020 IEEE 20th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) (01.01.2020)
Published in 2020 IEEE 20th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) (01.01.2020)
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Conference Proceeding