by Leonhardt, A., Nuytten, T., de la Rosa, C. J. Lockhart, Sergeant, S., Mootheri, V. K., Huyghebaert, C., De Gendt, S.
Published in ECS journal of solid state science and technology (01.10.2020)

by Leonhardt, A., Nuytten, T., de la Rosa, C. J. Lockhart, Sergeant, S., Mootheri, V. K., Huyghebaert, C., De Gendt, S.
Published in ECS journal of solid state science and technology (01.10.2020)

by Ghosh, S., Kruv, A., Smets, Q., Schram, T., Leech, D. J., Ding, T., Turkani, V., Groven, B., Dangel, A., Probst, G., Uhrmann, T., Wimplinger, M., Asselberghs, I., Lockhart de la Rosa, C. J., Brems, S., Kar, G. S.
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)

by Dorow, C. J., Schram, T., Smets, Q., O'Brien, K. P., Maxey, K., Lin, C.-C., Panarella, L., Kaczer, B., Arefin, N., Roy, A., Jordan, R., Oni, A., Penumatcha, A., Naylor, C. H., Kavrik, M., Cott, D., Graven, B., Afanasiev, V., Morin, P., Asselberghs, I., Lockhart de La Rosa, C. J., Sankar Kar, G., Metz, M., Avci, U.
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)