Experimental characterization of operational amplifiers: a system identification Approach-part I: theory and Simulations
Pintelon, R., Vandersteen, G., Ludwig De Locht, Rolain, Y., Schoukens, J.
Published in IEEE transactions on instrumentation and measurement (01.06.2004)
Published in IEEE transactions on instrumentation and measurement (01.06.2004)
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Journal Article
Estimating parameterized scalable models from the best linear approximation of nonlinear systems for accurate high-level simulations
Ludwig De Locht, Vandersteen, G., Rolain, Y., Pintelon, R.
Published in IEEE transactions on instrumentation and measurement (01.08.2006)
Published in IEEE transactions on instrumentation and measurement (01.08.2006)
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Journal Article
Estimating Scalable Common-Denominator Laplace-Domain MIMO Models in an Errors-in-Variables Framework
Vandersteen, Gerd, Locht, Ludwig De, Jenei, Snezana, Rolain, Yves, Pintelon, Rik
Published in Design, Automation and Test in Europe (07.03.2005)
Published in Design, Automation and Test in Europe (07.03.2005)
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Conference Proceeding
Measuring nonlinear devices to retrieve good system-level models
De Locht, Ludwig, Vandersteen, Gerd, Rolain, Yves, Rabijns, Daan
Published in 2005 66th ARFTG Microwave Measurement Conference (ARFTG) (01.12.2005)
Published in 2005 66th ARFTG Microwave Measurement Conference (ARFTG) (01.12.2005)
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Conference Proceeding
Nonlinearity analysis of Analog/RF circuits using combined multisine and volterra analysis
Borremans, Jonathan, De Locht, Ludwig, Wambacq, Piet, Rolain, Yves
Published in Design, Automation, and Test in Europe: Proceedings of the conference on Design, automation and test in Europe; 16-20 Apr. 2007 (16.04.2007)
Published in Design, Automation, and Test in Europe: Proceedings of the conference on Design, automation and test in Europe; 16-20 Apr. 2007 (16.04.2007)
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Conference Proceeding
Nonlinearity Analysis of Analog/RF Circuits Using Combined Multisine and Volterra Analysis
Borremans, J., De Locht, L., Wambacq, P., Rolain, Y.
Published in 2007 Design, Automation & Test in Europe Conference & Exhibition (01.04.2007)
Published in 2007 Design, Automation & Test in Europe Conference & Exhibition (01.04.2007)
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Conference Proceeding
On the efficiency loss of the local polynomial method for single experiment MIMO frequency response matrix extraction
Vandersteen, G., Ugryumova, D., Rolain, Y., De Locht, L., Pintelon, R., Schoukens, J.
Published in 2011 IEEE International Instrumentation and Measurement Technology Conference (01.05.2011)
Published in 2011 IEEE International Instrumentation and Measurement Technology Conference (01.05.2011)
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Conference Proceeding
Introducing the Power-Scalable Best Mixer Approximation
Vandermot, K., Van Moer, W., De Locht, L., Rolain, Y.
Published in 2008 IEEE Instrumentation and Measurement Technology Conference (01.05.2008)
Published in 2008 IEEE Instrumentation and Measurement Technology Conference (01.05.2008)
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Conference Proceeding
Identifying the main nonlinear contributions: use of multisine excitations during circuit design
De Locht, L., Vandersteen, G., Wambacq, P., Rolain, Y., Pintelon, R., Schoukens, J., Donnay, S.
Published in 64th ARFTG Microwave Measurements Conference, Fall 2004 (2004)
Published in 64th ARFTG Microwave Measurements Conference, Fall 2004 (2004)
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Conference Proceeding