Breakdowns in high-k gate stacks of nano-scale CMOS devices
Pey, K.L., Ranjan, R., Tung, C.H., Tang, L.J., Lo, V.L., Lim, K.S., Selvarajoo, T.A/L., Ang, D.S.
Published in Microelectronic engineering (01.06.2005)
Published in Microelectronic engineering (01.06.2005)
Get full text
Journal Article
Conference Proceeding
Selection of gate length and gate bias to make nanoscale metal–oxide-semiconductor transistors less sensitive to both statistical gate length variation and temperature variation
Yang, Peizhen, Lau, W.S., Lai, Seow Wei, Lo, V.L., Siah, S.Y., Chan, L.
Published in Solid-state electronics (01.11.2010)
Published in Solid-state electronics (01.11.2010)
Get full text
Journal Article
Observation of halo implant from the drain side reaching the source side and vice versa in extremely short p-channel transistors
Lau, W.S., Yang, Peizhen, Lim, Eng Hua, Tang, Yee Ling, Lai, Seow Wei, Lo, V.L., Siah, S.Y., Chan, L.
Published in Microelectronics and reliability (01.03.2010)
Published in Microelectronics and reliability (01.03.2010)
Get full text
Journal Article
Percolation resistance evolution during progressive breakdown in narrow MOSFETs
Lo, V.L., Pey, K.L., Tung, C.H., Ang, D.S., Foo, T.S., Tang, L.J.
Published in IEEE electron device letters (01.05.2006)
Published in IEEE electron device letters (01.05.2006)
Get full text
Journal Article
Effects of switching from [left angle bracket]1 1 0[right-pointing angle bracket] to [left angle bracket]1 0 0[right-pointing angle bracket] channel orientation and tensile stress on n-channel and p-channel metal-oxide-semiconductor transistors
Yang, Peizhen, Lau, W S, Lai, Seow Wei, Lo, V L, Siah, SY, Chan, L
Published in Solid-state electronics (01.04.2010)
Published in Solid-state electronics (01.04.2010)
Get full text
Journal Article
Mechanism for improvement of n-channel metal-oxide-semiconductor transistors by tensile stress
Yang, Peizhen, Lau, W. S., Lai, Seow Wei, Lo, V. L., Toh, L. F., Wang, Jacob, Siah, S. Y., Chan, L.
Published in Journal of applied physics (01.08.2010)
Published in Journal of applied physics (01.08.2010)
Get full text
Journal Article
Estimating Wind Velocities in Mountain Lee Waves Using Sailplane Flight Data
Millane, R P, Stirling, G D, Brown, R G, Zhang, N, Lo, V L, Enevoldson, E, Murray, J E
Published in Journal of atmospheric and oceanic technology (01.01.2010)
Published in Journal of atmospheric and oceanic technology (01.01.2010)
Get full text
Journal Article
Exponential dependence of percolation resistance on gate voltage and its impacts on progressive breakdown [MOSFETs]
Lo, V.L., Pey, K.L., Tung, C.H., Ang, D.S., Tang, L.J.
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)
Get full text
Conference Proceeding
Evaluating the overall impression of concert lighting: An integrated approach
Lo, VWL, Steemers, KA
Published in Lighting research & technology (London, England : 2001) (01.05.2022)
Published in Lighting research & technology (London, England : 2001) (01.05.2022)
Get full text
Journal Article
Estimating Wind Velocities in Mountain Lee Waves Using Sailplane Flight Data super()
Millane, R P, Stirling, G D, Brown, R G, Zhang, N, Lo, V L, Enevoldson, E, Murray, JE
Published in Journal of atmospheric and oceanic technology (01.01.2010)
Published in Journal of atmospheric and oceanic technology (01.01.2010)
Get full text
Journal Article
Abnormalities of left ventricular flow following mitral valve replacement: a colour flow Doppler study
Maire, R, Ikram, S, Odemuyiwa, O, Groves, P H, Lo, S V, Banning, A P, Hall, R J
Published in European heart journal (01.03.1994)
Published in European heart journal (01.03.1994)
Get more information
Journal Article
Impact of Gate Dielectric Breakdown Induced Microstructural Defects on Transistor Reliability
Li, Xiang, Pey, Kin Leong, Lo, Vui Lip, Ranjan, Rakesh, Tung, Chih Hang, Tang, Lei Jun
Published in ECS transactions (10.07.2009)
Published in ECS transactions (10.07.2009)
Get full text
Journal Article
A Critical Gate Voltage Triggering Irreversible Gate Dielectric Degradation
Lo, V.L., Pey, K.L., Tung, C.H., Ang, D.S.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Get full text
Conference Proceeding
REconstruction Of Macromolecular Envelopes From Crystal x-ray diffraction amplitudes
Lo, V.L., Millane, R.P., Kingston, R.L.
Published in 2008 15th IEEE International Conference on Image Processing (01.10.2008)
Published in 2008 15th IEEE International Conference on Image Processing (01.10.2008)
Get full text
Conference Proceeding