Si cleaning method without surface morphology change by cyanide solutions
Takahashi, Masao, Liu, Yueh-Ling, Narita, Hiroaki, Kobayashi, Hikaru
Published in Applied surface science (15.04.2008)
Published in Applied surface science (15.04.2008)
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Journal Article
Conference Proceeding
Methods of observation and elimination of semiconductor defect states
Kobayashi, Hikaru, Liu, Yueh-Ling, Yamashita, Yoshiyuki, Ivánčo, Jan, Imai, Shigeki, Takahashi, Masao
Published in Solar energy (01.06.2006)
Published in Solar energy (01.06.2006)
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Journal Article
Conference Proceeding
SiC Cleaning Method by Use of Dilute HCN Aqueous Solutions
Madani, Mohammad, Liu, Yueh-Ling, Takahashi, Masao, Iwasa, Hitoo, Kobayashi, Hikaru
Published in Journal of the Electrochemical Society (2008)
Published in Journal of the Electrochemical Society (2008)
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Journal Article
Silicon cleaning and defect passivation effects of hydrogen cyanide aqueous solutions
Takahashi, Masao, Liu, Yueh-Ling, Fujiwara, Naozumi, Iwasa, Hitoo, Kobayashi, Hikaru
Published in Solid state communications (01.02.2006)
Published in Solid state communications (01.02.2006)
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Journal Article
Mechanism of copper removal from SiO2 surfaces by hydrogen cyanide aqueous solutions
Fujiwara, Naozumi, Liu, Yueh-Ling, Takahashi, Masao, Kobayashi, Hikaru
Published in Journal of the Electrochemical Society (01.01.2006)
Published in Journal of the Electrochemical Society (01.01.2006)
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Journal Article
Passivation of defect states in Si-based and GaAs structures
Pinčík, E., Kobayashi, H., Brunner, R., Takahashi, M., Liu, Yueh-Ling, Ortega, L., Imamura, K., Jergel, M., Rusnák, J.
Published in Applied surface science (15.10.2008)
Published in Applied surface science (15.10.2008)
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Journal Article
Conference Proceeding
Reaction of cyanide ions with copper on Si surfaces and its use for Si cleaning
Liu, Yueh-Ling, Fujiwara, Naozumi, Iwasa, Hitoo, Takahashi, Masao, Imai, Shigeki, Kobayashi, Hikaru
Published in Surface science (01.03.2006)
Published in Surface science (01.03.2006)
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