An Analytical Study of the Effect of Total Ionizing Dose on Body Current in 130-nm PDSOI I/O nMOSFETs
Xie, Xin, Zhu, Huilong, Zhang, Mengying, Liu, Xiaonian, Dai, Lihua, Bi, Dawei, Hu, Zhiyuan, Zhang, Zhengxuan, Zou, Shichang
Published in IEEE transactions on nuclear science (01.03.2019)
Published in IEEE transactions on nuclear science (01.03.2019)
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Journal Article
A green and effective anti-corrosion and anti-microbial inhibitor of citric acid-based carbon dots: Experiment and mechanism analysis
Huang, Weilong, Tang, Zhiji, Liu, Xiaonian, Liu, Lin, Zhong, Huanglian, Yu, Yanyan, Chen, H., Wang, C., Jiang, Qiuhua, Ye, Y.W., Ye, Xinyun
Published in Journal of materials research and technology (01.09.2024)
Published in Journal of materials research and technology (01.09.2024)
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Journal Article
Degradation induced by TID radiation and hot-carrier stress in 130-nm short channel PDSOI NMOSFETs
Dai, Lihua, Liu, Xiaonian, Zhang, Mengying, Zhang, Leqing, Hu, Zhiyuan, Bi, Dawei, Zhang, Zhengxuan, Zou, Shichang
Published in Microelectronics and reliability (01.07.2017)
Published in Microelectronics and reliability (01.07.2017)
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Journal Article
Influences of silicon-rich shallow trench isolation on total ionizing dose hardening and gate oxide integrity in a 130 nm partially depleted SOI CMOS technology
Song, Lei, Hu, Zhiyuan, Zhang, Mengying, Liu, Xiaonian, Dai, Lihua, Zhang, Zhengxuan, Zou, Shichang
Published in Microelectronics and reliability (01.07.2017)
Published in Microelectronics and reliability (01.07.2017)
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Journal Article
Anomalous Electrical Properties Induced by Hot-Electron-Injection in 130-nm Partially Depleted SOI NMOSFETs Fabricated on Modified Wafer
Dai, Lihua, Bi, Dawei, Ning, Bingxu, Hu, Zhiyuan, Song, Lei, Liu, Xiaonian, Zhang, Mengying, Zhang, Zhengxuan, Zou, Shichang
Published in IEEE transactions on nuclear science (01.10.2016)
Published in IEEE transactions on nuclear science (01.10.2016)
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Journal Article
An analytical model for the body contact current of PDSOI nMOSFETs
Liu, Xiaonian, Jin, Xiangliang, Zheng, Zhiwei, Dong, Jun
Published in Solid-state electronics (01.08.2023)
Published in Solid-state electronics (01.08.2023)
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Journal Article
Influences of silicon-rich shallow trench isolation on total ionizing dose hardening and gate oxide integrity in a 130nm partially depleted SOI CMOS technology
Song, Lei, Hu, Zhiyuan, Zhang, Mengying, Liu, Xiaonian, Dai, Lihua, Zhang, Zhengxuan, Zou, Shichang
Published in Microelectronics and reliability (01.07.2017)
Published in Microelectronics and reliability (01.07.2017)
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Journal Article
Learning based decomposition for polarmetric SAR images
Chu He, Qian Feng, Ming Liu, Xiaonian Liu, Mingsheng Liao
Published in 2011 IEEE International Geoscience and Remote Sensing Symposium (01.07.2011)
Published in 2011 IEEE International Geoscience and Remote Sensing Symposium (01.07.2011)
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Conference Proceeding
A Deep-Learning Based BSIM-CMG FinFET Modeling and Parameter Extraction Approach
Liu, Yansen, Liu, Xiaonian, Cao, Peng
Published in 2024 International Conference on Electronic Engineering and Information Systems (EEISS) (13.01.2024)
Published in 2024 International Conference on Electronic Engineering and Information Systems (EEISS) (13.01.2024)
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Conference Proceeding
Ten-Winged Butterfly Chaotic System Based on Julia Fractal
Yang, Zichen, Liu, Xiaonian, Li, Mao, Hong, Xuexing, Zhou, Ying, Yang, Zhipeng
Published in 2023 7th International Conference on Robotics and Automation Sciences (ICRAS) (16.06.2023)
Published in 2023 7th International Conference on Robotics and Automation Sciences (ICRAS) (16.06.2023)
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Conference Proceeding
A macro SPICE model for 2-bits/cell split-gate flash memory cell
Liu, Xiaonian, Xu, Yiran, Fan, Xiangquan, Liao, Mengxing, Li, Pingliang, Zou, Shichang
Published in Microelectronics (01.05.2017)
Published in Microelectronics (01.05.2017)
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Journal Article