A Study of Gate-Sensing and Channel-Sensing (GSCS) Transient Analysis Method-Part I: Fundamental Theory and Applications to Study of the Trapped Charge Vertical Location and Capture Efficiency of SONOS-Type Devices
Lue, Hang-Ting, Du, Pei-Ying, Wang, Szu-Yu, Hsieh, Kuang-Yeu, Liu, Rich, Lu, Chih-Yuan
Published in IEEE transactions on electron devices (01.08.2008)
Published in IEEE transactions on electron devices (01.08.2008)
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Journal Article
Physical Model of Field Enhancement and Edge Effects of FinFET Charge-Trapping NAND Flash Devices
HSU, Tzu-Hsuan, LUE, Hang-Ting, KING, Ya-Chin, HSIAO, Yi-Hsuan, LAI, Sheng-Chih, HSIEH, Kuang-Yeu, LIU, Rich, LU, Chih-Yuan
Published in IEEE transactions on electron devices (01.06.2009)
Published in IEEE transactions on electron devices (01.06.2009)
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Journal Article
A High-Performance Body-Tied FinFET Bandgap Engineered SONOS (BE-SONOS) for nand-Type Flash Memory
Tzu-Hsuan Hsu, Hang Ting Lue, Ya-Chin King, Jung-Yu Hsieh, Lai, E.-K., Kuang-Yeu Hsieh, Rich Liu, Chih-Yuan Lu
Published in IEEE electron device letters (01.05.2007)
Published in IEEE electron device letters (01.05.2007)
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Journal Article
Extended-pulse excimer laser annealing of Pb(Zr1−xTix)O3 thin film on LaNiO3 electrode
Lai, S. C., Lue, Hang-Ting, Hsieh, K. Y., Lung, S. L., Liu, Rich, Wu, T. B., Donohue, P. P., Rumsby, P.
Published in Journal of applied physics (01.09.2004)
Published in Journal of applied physics (01.09.2004)
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Journal Article
Tungsten Oxide Resistive Memory Using Rapid Thermal Oxidation of Tungsten Plugs
Lai, Erh-Kun, Chien, Wei-Chih, Chen, Yi-Chou, Hong, Tian-Jue, Lin, Yu-Yu, Chang, Kuo-Pin, Yao, Yeong-Der, Lin, Pang, Horng, Sheng-Fu, Gong, Jeng, Tsai, Shih-Chang, Lee, Ching-Hsiung, Hsieh, Sheng-Hui, Chen, Chun-Fu, Shih, Yen-Hao, Hsieh, Kuang-Yeu, Liu, Rich, Lu, Chih-Yuan
Published in Japanese Journal of Applied Physics (01.04.2010)
Published in Japanese Journal of Applied Physics (01.04.2010)
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Journal Article
Study of the Erase Mechanism of MANOS ( \hbox\hbox/\hbox/\hbox) Device
LAI, Sheng-Chih, LUE, Hang-Ting, HSIEH, Kuang-Yeu, LIU, Rich, LU, Chih-Yuan, HSIEH, Jong-Yu, YANG, Ming-Jui, CHIOU, Yan-Kai, WU, Chia-Wei, WU, Tai-Bor, LUO, Guang-Li, CHIEN, Chao-Hsin, LAI, Erh-Kun
Published in IEEE electron device letters (01.07.2007)
Published in IEEE electron device letters (01.07.2007)
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Journal Article
A single-sided PHINES SONOS memory featuring high-speed and low-power applications
WU, Jau-Yi, LEE, Ming-Hsiu, HSU, Tzu-Hsuan, LUNG, Hsiang-Lan, LIU, Rich, LU, Chih-Yuan
Published in IEEE electron device letters (01.02.2006)
Published in IEEE electron device letters (01.02.2006)
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Journal Article
A Novel Gate-Injection Program/Erase P-Channel NAND-Type Flash Memory with High (10M Cycle) Endurance
Hang-Ting Lue, Erh-Kun Lai, Szu-Yu Wang, Ling-Wu Yang, Tahone Yang, Kuang-Chao Chen, Kuang-Yeu Hsieh, Rich Liu, Chih-Yuan Lu
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
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Conference Proceeding
Scaling evaluation of BE-SONOS NAND flash beyond 20 nm
Hang-Ting Lue, Tzu-Hsuan Hsu, Lai, S.C., Hsiao, Y.H., Peng, W.C., Liao, C.W., Huang, Y.F., Hong, S.P., Wu, M.T., Hsu, F.H., Lien, N.Z., Wang, S.Y., Yang, L.W., Yang, T., Chen, K.C., Hsieh, K.Y., Rich Liu, Chih-Yuan Lu
Published in 2008 Symposium on VLSI Technology (01.06.2008)
Published in 2008 Symposium on VLSI Technology (01.06.2008)
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Conference Proceeding
A Novel Gate-Sensing and Channel-Sensing Transient Analysis Method for Real-Time Monitoring of Charge Vertical Location in Sonos-Type Devices and its Applications in Reliability Studies
Hang-Ting Lue, Pei-Ying Du, Szu-Yu Wang, Erh-Kun Lai, Kuang-Yeu Hsieh, Rich Liu, Chih-Yuan Lu
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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Conference Proceeding
Reliability and Processing Effects of Bandgap Engineered SONOS (BE-SONOS) Flash Memory
Szu-Yu Wang, Hang-Ting Lue, Erh-Kun Lai, Ling-Wu Yang, Tahone Yang, Kuang-Chao Chen, Jeng Gong, Kuang-Yeu Hsieh, Rich Liu, Chih Yuan Lu
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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Conference Proceeding
Reliability study of MANOS with and without a SiO2 buffer layer and BE-MANOS charge-trapping NAND flash devices
Chien-Wei Liao, Sheng-Chih Lai, Hang-Ting Lue, Ming-Jui Yang, Chin-Yen Shen, Yi-Hsien Lue, Yu-Fong Huang, Jung-Yu Hsieh, Szu-Yu Wang, Guang-Li Luo, Chao-Hsin Chien, Kuang-Yeu Hsieh, Rich Liu, Chih-Yuan Lu
Published in 2009 International Symposium on VLSI Technology, Systems, and Applications (01.04.2009)
Published in 2009 International Symposium on VLSI Technology, Systems, and Applications (01.04.2009)
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Conference Proceeding
A study of SONOS charge loss mechanism after hot-hole stressing using trap-layer engineering and electrical re-fill methods
Yi-Hsuan Hsiao, Hang-Ting Lue, Lee, M.Y., Shih-Chieh Huang, Tsung-Yi Chou, Szu-Yu Wang, Kuang-Yeu Hsieh, Rich Liu, Chih-Yuan Lu
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
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Conference Proceeding
Study of Charge Loss Mechanism of SONOS-Type Devices using Hot-Hole Erase and Methods to Improve the Charge Retention
Hang-Ting Lue, Yi-Hsuan Hsiao, Yen-Hao Shih, Erh-Kun Lai, Kuang-Yeu Hsieh, Rich Liu, Chih-Yuan Lu
Published in 2006 IEEE International Reliability Physics Symposium Proceedings (01.01.2006)
Published in 2006 IEEE International Reliability Physics Symposium Proceedings (01.01.2006)
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Conference Proceeding
A Novel Channel-Program-Erase Technique with Substrate Transient Hot Carrier Injection for SONOS Memory Application
Tzu-Hsuan Hsu, Jau-Yi Wu, Ya Chin King, Hang Ting Lue, Yen Hao Shih, Erh-Kun Lai, Kuang-Yeu Hsieh, Rich Liu, Chih-Yuan Lu
Published in 2006 European Solid-State Device Research Conference (01.09.2006)
Published in 2006 European Solid-State Device Research Conference (01.09.2006)
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Conference Proceeding
AC-SONOS: a single-poly, assist-charge induced source-side-injection SONOS low power nonvolatile memory
Ming-Hsiu Lee, Jau-Yi Wu, Ming-Chang Kuo, Tzu-Hsuan Hsu, Hsiang-Lan Lung, Tiao-Yuan Huang, Rich Liu, Chih-Yuan Lu
Published in Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005 (2005)
Published in Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005 (2005)
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Conference Proceeding
Non-Volatile Memory Technology-Today and Tomorrow
Chih-Yuan Lu, Tao-Cheng Lu, Rich Liu
Published in 2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2006)
Published in 2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2006)
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Conference Proceeding