Examination of In-Grown Stacking Faults in 8°- and 4°-Offcut 4H-SiC Epitaxy by Photoluminescence Imaging
Liu, Kendrick X., Stahlbush, Robert E., Lew, Kok-Keong, Myers-Ward, Rachael L., VanMil, Brenda L., Gaskill, Kurt D., Eddy, Charles R.
Published in Journal of electronic materials (01.05.2008)
Published in Journal of electronic materials (01.05.2008)
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Journal Article
Investigation of Electron–Hole Recombination-Activated Partial Dislocations and Their Behavior in 4H-SiC Epitaxial Layers
Chen, Yi, Zhang, Ning, Dudley, Michael, Caldwell, Joshua D., Liu, Kendrick X., Stahlbush, Robert E., Huang, Xianrong, Macrander, Albert T., Black, David R.
Published in Journal of electronic materials (01.05.2008)
Published in Journal of electronic materials (01.05.2008)
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Journal Article
Nondestructive dislocation delineation using topographically enhanced imaging of surface morphologies in 4H-SiC epitaxial layers
Picard, Yoosuf N., Liu, Kendrick X., Stahlbush, Robert E., Twigg, Mark E., Zhang, Xuan, Skowronski, Marek
Published in Journal of applied physics (01.04.2008)
Published in Journal of applied physics (01.04.2008)
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Journal Article
Photoresponse of gated p-silicon field emitter array and correlation with theoretical models
Liu, Kendrick X., Chiang, Chin-Jen, Heritage, Jonathan P.
Published in Journal of applied physics (01.02.2006)
Published in Journal of applied physics (01.02.2006)
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Journal Article
Nondestructive dislocation delineation using topographically enhanced imaging of surface morphologies in 4 H - Si C epitaxial layers
Picard, Yoosuf N., Liu, Kendrick X., Stahlbush, Robert E., Twigg, Mark E., Zhang, Xuan, Skowronski, Marek
Published in Journal of applied physics (07.04.2008)
Published in Journal of applied physics (07.04.2008)
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Journal Article
Photoresponse of gated p -silicon field emitter array and correlationwith theoretical models
Liu, Kendrick X., Chiang, Chin-Jen, Heritage, Jonathan P.
Published in Journal of applied physics (02.02.2006)
Published in Journal of applied physics (02.02.2006)
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Journal Article
Influence of Shockley stacking fault propagation and contraction on electrical behavior of 4H-SiC pin diodes and DMOSFETs
Caldwell, J.D., Stahlbush, R.E., Glembocki, O.J., Hobart, K.D., Imhoff, E.A., Tadjer, M.J., Liu, K.X.
Published in 2007 International Semiconductor Device Research Symposium (01.12.2007)
Published in 2007 International Semiconductor Device Research Symposium (01.12.2007)
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Conference Proceeding
Examination of In-Grown Stacking Faults in 8 deg - and 4 deg -Offcut 4H-SiC Epitaxy by Photoluminescence Imaging
Liu, Kendrick X, Stahlbush, Robert E, Lew, Kok-Keong, Myers-Ward, Rachael L, Vanmil, Brenda L, Gaskill, Kurt D, Eddy, Charles R
Published in Journal of electronic materials (01.05.2008)
Published in Journal of electronic materials (01.05.2008)
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Journal Article
Examination of In-Grown Stacking Faults in 8°-and 4°-Offcut 4H-SiC Epitaxy by Photoluminescence Imaging: Groups in Nitrides, SiC and ZnO
LIU, Kendrick X, STAHLBUSH, Robert E, LEW, Kok-Keong, MYERS-WARD, Rachael L, VANMIL, Brenda L, GASKILL, Kurt D, EDDY, Charles R
Published in Journal of electronic materials (2008)
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Published in Journal of electronic materials (2008)
Journal Article
Thermal annealing and propagation of shockley stacking faults in 4H-SiC PiN diodes: Group III Nitrides, SiC and ZnO
CALDWELL, Joshua D, LIU, Kendrick X, TADJER, Marko J, GLEMBOCKI, Orest J, STAHLBUSH, Robert E, HOBART, Karl D, KUB, Fritz
Published in Journal of electronic materials (2007)
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Published in Journal of electronic materials (2007)
Journal Article
Photoluminescence and electroluminescence imaging of carrot defect in 4H-SiC epitaxy: Group III Nitrides, SiC and ZnO
LIU, Kendrick X, STAHLBUSH, Robert E, TWIGG, Mark E, CALDWELL, Joshua D, GLASER, Evan R, HOBART, Karl D, KUB, Francis J
Published in Journal of electronic materials (2007)
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Published in Journal of electronic materials (2007)
Journal Article
Effects of Dislocations and Stacking Faults on the Reliability of 4H-SiC PiN Diodes
Stahlbush, R.E., Liu, K.X., Twigg, M.E.
Published in 2006 IEEE International Reliability Physics Symposium Proceedings (01.03.2006)
Published in 2006 IEEE International Reliability Physics Symposium Proceedings (01.03.2006)
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Conference Proceeding
Ultra-fast p-Si Field Emitter Array Photocathode
Chin-Jen Chiang, Liu, K.X., Heritage, J.P.
Published in 2007 Conference on Lasers and Electro-Optics (CLEO) (01.05.2007)
Published in 2007 Conference on Lasers and Electro-Optics (CLEO) (01.05.2007)
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Conference Proceeding
Photo-response measurements and temporal analyses of gated p-silicon field emitter array
Liu, K.X., Chin-Jen Chiang, Heritage, J.P.
Published in 2005 International Vacuum Nanoelectronics Conference (2005)
Published in 2005 International Vacuum Nanoelectronics Conference (2005)
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Conference Proceeding
Sub-microsecond photo-excitation of gated p-type silicon field emitter arrays
Chin-Jen Chiang, Liu, K.X., Heritage, J.P.
Published in 2005 International Vacuum Nanoelectronics Conference (2005)
Published in 2005 International Vacuum Nanoelectronics Conference (2005)
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Conference Proceeding
TRANSPARENT NANOCRYSTALLINE DIAMOND CONTACTS TO WIDE BANDGAP SEMICONDUCTOR DEVICES
TADJER MARKO J, FEYGELSON TATYANA I, CALDWELL JOSHUA D, LIU KENDRICK X, KUB FRANCIS J, HOBART KARL D
Year of Publication 09.04.2009
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Year of Publication 09.04.2009
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