by Fragner, H., Dielacher, A., Moritsch, M., Wickert, J., Koudelka, O., Hoeg, P., Cardellach, E., Martin-Neira, M., Semmling, M., Walker, R., Lissi, F.P.
Published in IGARSS 2020 - 2020 IEEE International Geoscience and Remote Sensing Symposium (26.09.2020)