Performance and reliability of Ultra-Thin HfO2-based RRAM (UTO-RRAM)
Govoreanu, B., Ajaykumar, A., Lipowicz, H., Chen, Y.-Y, Liu, J.-C, Degraeve, R., Zhang, L., Clima, S., Goux, L., Radu, I. P., Fantini, A., Raghavan, N., Kar, G.-S, Kim, W., Redolfi, A., Wouters, D. J., Altimime, L., Jurczak, M.
Published in 2013 5th IEEE International Memory Workshop (01.05.2013)
Published in 2013 5th IEEE International Memory Workshop (01.05.2013)
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