Integrated Procedure Automating Test Chip Layout, Place and Route, and Test Plan Development for Efficient Parametric Device and Process Design
Gabrys, A., Greig, W., West, A.J., Lindorfer, P., French, W., Mondal, S., Patra, D., Goswami, K., Sural, S., Crandle, T.
Published in IEEE transactions on semiconductor manufacturing (01.02.2009)
Published in IEEE transactions on semiconductor manufacturing (01.02.2009)
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Journal Article
Electrical characteristics and reliability of extended drain voltage NMOS devices with multi-RESURF junction
Vashchenko, V.A., Brisbin, D., Lindorfer, P., Chaparala, P., Hopper, P.
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)
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Conference Proceeding
Analysis of the breakdown phenomena in GaAs MESFETs
Ashworth, J., Lindorfer, P.
Published in ESSDERC '90: 20th European Solid State Device Research Conference (01.09.1990)
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Published in ESSDERC '90: 20th European Solid State Device Research Conference (01.09.1990)
Conference Proceeding
Substrate Current Independent Hot Carrier Degradation in NLDMOS Devices
Brisbin, D., Lindorfer, P., Chaparala, P.
Published in 2006 IEEE International Reliability Physics Symposium Proceedings (01.03.2006)
Published in 2006 IEEE International Reliability Physics Symposium Proceedings (01.03.2006)
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Conference Proceeding
Numerical simulation of metal interconnects of power semiconductor devices
Ershov, M, Tcherniaev, A, Feinberg, Y, Lindorfer, P, French, W, Hopper, P
Published in 2010 22nd International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.06.2010)
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Published in 2010 22nd International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.06.2010)
Conference Proceeding
Anomalous Safe Operating Area and Hot Carrier Degradation of NLDMOS Devices
Brisbin, D., Lindorfer, P., Chaparala, P.
Published in IEEE transactions on device and materials reliability (01.09.2006)
Published in IEEE transactions on device and materials reliability (01.09.2006)
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Magazine Article
The Viennese integrated system for technology CAD applications
Halama, S., Fasching, F., Fischer, C., Kosina, H., Leitner, E., Lindorfer, P., Pichler, Ch, Pimingstorfer, H., Puchner, H., Rieger, G., Schrom, G., Simlinger, T., Stiftinger, M., Stippel, H., Strasser, E., Tuppa, W., Wimmer, K., Selberherr, S.
Published in Microelectronics (01.03.1995)
Published in Microelectronics (01.03.1995)
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Journal Article
Photo Misalignment Impact on the Hot Carrier Reliability of Lateral DMOS Devices
Brisbin, D., Lindorfer, P., Chaparala, P.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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Conference Proceeding
Thermal characterization of high power transistor arrays
Maize, K., Xi Wang, Kendig, D., Shakouri, A., French, W., O'Connell, B., Lindorfer, P., Hopper, P.
Published in 2009 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (01.03.2009)
Published in 2009 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (01.03.2009)
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Conference Proceeding
Effect of Photo Misalignment on N-LDMOS Hot Carrier Device Reliability
Brisbin, D., Lindorfer, P., Chaparala, P.
Published in 2006 IEEE International Integrated Reliability Workshop Final Report (01.10.2006)
Published in 2006 IEEE International Integrated Reliability Workshop Final Report (01.10.2006)
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Conference Proceeding
Highly automated test chip layout and test plan development for parametric electrical test
Gabrys, A., Greig, W., West, A.J., Lindorfer, P., French, W.
Published in 2008 IEEE International Conference on Microelectronic Test Structures (01.03.2008)
Published in 2008 IEEE International Conference on Microelectronic Test Structures (01.03.2008)
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Conference Proceeding
Implementation of high VT turn-on in low-voltage SCR devices
Vashchenko, V.A., Lindorfer, P., Hopper, P.
Published in 2005 Electrical Overstress/Electrostatic Discharge Symposium (01.09.2005)
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Published in 2005 Electrical Overstress/Electrostatic Discharge Symposium (01.09.2005)
Conference Proceeding
Study of power arrays in ESD operation regimes
Aliaj, B, Vashchenko, V, Lindorfer, P, Tcherniaev, A, Ershov, M, Liou, J J, Hopper, P
Published in Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010 (01.10.2010)
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Published in Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010 (01.10.2010)
Conference Proceeding
Effect of body-to-source bias on the analog characteristics of 0.35 /spl mu/m partially depleted SOI CMOS for low-voltage low-power mixed-mode applications
Babcock, J.A., Francis, P., Haggag, H., Darmawan, J., Lee, T.-W., Lindorfer, P., Olgaard, C., Merrill, R.B., Schroder, D. K.
Published in 1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199) (1998)
Published in 1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199) (1998)
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Conference Proceeding
Monte-Carlo — Poisson coupling using transport coefficients
Kosina, H., Lindorfer, Ph, Selberherr, S.
Published in ESSDERC '91: 21st European Solid State Device Research Conference (1991)
Published in ESSDERC '91: 21st European Solid State Device Research Conference (1991)
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Journal Article
Conference Proceeding
GaAs MESFET simulation with MINIMOS
Lindorfer, P., Selberherr, S.
Published in 11th Annual Gallium Arsenide Integrated Circuit (GaAs IC) Symposium (1989)
Published in 11th Annual Gallium Arsenide Integrated Circuit (GaAs IC) Symposium (1989)
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Conference Proceeding
Connection of Network and Device Simulation
Dickinger, P., Lindorfer, P., Nanz, G., Selberherr, S.
Published in Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits (1990)
Published in Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits (1990)
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Conference Proceeding