Study of a phenomenon of high error WL in mixed read and program operations in 3-D NAND flash
Zhang, Xuhang, Ma, Dongfang, Lin, Weijie, Cheng, Zhiyuan
Published in 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) (01.06.2019)
Published in 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) (01.06.2019)
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