Modeling Advanced FET Technology in a Compact Model
Dunga, M.V., Chung-Hsun Lin, Xuemei Xi, Lu, D.D., Niknejad, A.M., Chenming Hu
Published in IEEE transactions on electron devices (01.09.2006)
Published in IEEE transactions on electron devices (01.09.2006)
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Journal Article
Performance-Aware Corner Model for Design for Manufacturing
Chung-Hsun Lin, Dunga, M.V., Lu, D.D., Niknejad, A.M., Chenming Hu
Published in IEEE transactions on electron devices (01.04.2009)
Published in IEEE transactions on electron devices (01.04.2009)
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Journal Article
Ultrathin ferroic HfO2–ZrO2 superlattice gate stack for advanced transistors
Cheema, Suraj S., Shanker, Nirmaan, Wang, Li-Chen, Hsu, Cheng-Hsiang, Hsu, Shang-Lin, Liao, Yu-Hung, San Jose, Matthew, Gomez, Jorge, Chakraborty, Wriddhi, Li, Wenshen, Bae, Jong-Ho, Volkman, Steve K., Kwon, Daewoong, Rho, Yoonsoo, Pinelli, Gianni, Rastogi, Ravi, Pipitone, Dominick, Stull, Corey, Cook, Matthew, Tyrrell, Brian, Stoica, Vladimir A., Zhang, Zhan, Freeland, John W., Tassone, Christopher J., Mehta, Apurva, Saheli, Ghazal, Thompson, David, Suh, Dong Ik, Koo, Won-Tae, Nam, Kab-Jin, Jung, Dong Jin, Song, Woo-Bin, Lin, Chung-Hsun, Nam, Seunggeol, Heo, Jinseong, Parihar, Narendra, Grigoropoulos, Costas P., Shafer, Padraic, Fay, Patrick, Ramesh, Ramamoorthy, Mahapatra, Souvik, Ciston, Jim, Datta, Suman, Mohamed, Mohamed, Hu, Chenming, Salahuddin, Sayeef
Published in Nature (London) (07.04.2022)
Published in Nature (London) (07.04.2022)
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Journal Article
Extraction of Effective Oxide Thickness for SOI FINFETs With High- \kappa/Metal Gates Using the Body Effect
Paul, Sujata, Yeh, Frank, Maitra, Kingsuk, Chung-Hsun Lin, Kerber, Andreas, Kulkarni, Pranita, Jagannathan, Hemanth, Basker, Veeraraghavan S, Miller, Robert J, Huiming Bu
Published in IEEE electron device letters (01.07.2010)
Published in IEEE electron device letters (01.07.2010)
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Journal Article
Perspectives on Backside Power (PowerVia)
Shamanna, M., Fischer, K., Hafez, W., Jiang, L., Kobrinsky, M., Lin, Chung-Hsun, Mistry, K., Natarajan, S., Ramaswamy, R., Sell, B.
Published in 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (03.03.2024)
Published in 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (03.03.2024)
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Conference Proceeding
Non-planar device architecture for 15nm node: FinFET or trigate?
Chung-Hsun Lin, Chang, J, Guillorn, M, Bryant, A, Oldiges, P, Haensch, W
Published in 2010 IEEE International SOI Conference (SOI) (01.10.2010)
Published in 2010 IEEE International SOI Conference (SOI) (01.10.2010)
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Conference Proceeding
BSIM-MG: A Versatile Multi-Gate FET Model for Mixed-Signal Design
Dunga, M.V., Chung-Hsun Lin, Lu, D.D., Weize Xiong, Cleavelin, C.R., Patruno, P., Jiunn-Ren Hwang, Fu-Liang Yang, Niknejad, A.M., Chenming Hu
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
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Conference Proceeding
Identifying High PPI Clusters by Integrating Data and Knowledge Sources
Lin, Chung-Hsun, Hsiao, Yu-Ting, Lee, Wei-Po
Published in Lecture notes in engineering and computer science (04.07.2018)
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Published in Lecture notes in engineering and computer science (04.07.2018)
Journal Article
HOT-carrier degradation in undoped-body ETSOI FETS and SOI FINFETS
Miaomiao Wang, Kulkarni, Pranita, Kangguo Cheng, Khakifirooz, Ali, Basker, V S, Jagannathan, Hemanth, Chun-Chen Yeh, Paruchuri, Vamsi, Doris, Bruce, Huiming Bu, Chung-Hsun Lin, Stathis, James H, Maitra, Kingsuk, Oldiges, Philip J
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
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Conference Proceeding
Patterning nanowire and micro-/nanoparticle array on micropillar-structured surface: Experiment and modeling
Lin, Chung Hsun, Guan, Jingjiao, Chau, Shiu Wu, Chen, Shia Chung, Lee, L. James
Published in Biomicrofluidics (04.08.2010)
Published in Biomicrofluidics (04.08.2010)
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Journal Article
NANOWIRE TRANSISTORS AND METHODS OF FABRICATION
CHAO ROBIN, FISCHER KEVIN, TSAI CURTIS, GUHA BISWAJEET, GREENE BRIAN, FAUST ADAM, LIN CHUNG HSUN
Year of Publication 04.01.2022
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Year of Publication 04.01.2022
Patent
Compact Modeling of Variation in FinFET SRAM Cells
Lu, D.D., Chung-Hsun Lin, Niknejad, A.M., Chenming Hu
Published in IEEE design & test of computers (01.03.2010)
Published in IEEE design & test of computers (01.03.2010)
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Journal Article
Replacement metal gate resistance in FinFET architecture modelling, validation and extendibility
Ruqiang Bao, Greene, Brian, Unoh Kwon, Sungjae Lee, Bruley, John, Weike Wang, Kai Zhao, DeHaven, Patrick W., Zhengwen Li, Wong, Keith, Grunow, Stephan, Divakaruni, Rama, Chung-Hsun Lin, Krishnan, Siddarth A., Narayanan, Vijay
Published in 2015 IEEE International Electron Devices Meeting (IEDM) (01.12.2015)
Published in 2015 IEEE International Electron Devices Meeting (IEDM) (01.12.2015)
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Conference Proceeding
Journal Article
A comparative study of fin-last and fin-first SOI FinFETs
Lu, Darsen, Chang, Josephine, Guillorn, Michael A., Chung-Hsun Lin, Johnson, Jeffrey, Oldiges, Philip, Rim, Ken, Khare, Mukesh, Haensch, Wilfried
Published in 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2013)
Published in 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2013)
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Conference Proceeding
Modeling of width-quantization-induced variations in logic FinFETs for 22nm and beyond
Chung-Hsun Lin, Haensch, W., Oldiges, P., Hailing Wang, Williams, R., Chang, J., Guillorn, M., Bryant, A., Yamashita, T., Standaert, T., Bu, H., Leobandung, E., Khare, M.
Published in 2011 Symposium on VLSI Technology - Digest of Technical Papers (01.06.2011)
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Published in 2011 Symposium on VLSI Technology - Digest of Technical Papers (01.06.2011)
Conference Proceeding
GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING DEVICES WITH CHANNEL-TO-SUBSTRATE ELECTRICAL CONTACT
JACK NATHAN, GUHA BISWAJEET, KAR AYAN, HSU WILLIAM, LIN CHUNG HSUN, KOLLURU KALYAN, GHANI TAHIR, GOLONZKA OLEG, THOMSON NICHOLAS, PHOA KINYIP, ORR BENJAMIN
Year of Publication 28.06.2021
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Year of Publication 28.06.2021
Patent