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Published in Environmental technology (23.02.2022)
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The effect of nitridation and sulfur passivation for In 0.53 Ga 0.47 As surfaces on their Al/Al 2 O 3 /InGaAs MOS capacitors properties
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Published in Journal of semiconductors (01.02.2016)
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The effect of nitridation and sulfur passivation for In0.53Ga0.47As surfaces on their Al/Al2O3/InGaAs MOS capacitors propertiesProject supported by the National Natural Science Foundation of China (Nos. 61274077, 61474031, 61464003), the Guangxi Natural Science Foundation (Nos. 2013GXNSFGA019003, 2013GXNSFAA019335), the Project (No. 9140C140101140C14069), the Innovation Project of GUET Graduate Education (No. YJCXS201529), and the National Science & Technology Major Project of China (No. 2011ZX0
Lin, Zizeng, Cao, Mingmin, Wang, Shengkai, Li, Qi, Xiao, Gongli, Gao, Xi, Liu, Honggang, Li, Haiou
Published in Journal of semiconductors (01.02.2016)
Published in Journal of semiconductors (01.02.2016)
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Journal Article
The effect of nitridation and sulfur passivation for In sub(0.53)Ga sub(0.47)As surfaces on their Al/Al sub(2)O sub(3)/InGaAs MOS capacitors properties
Zizeng, Lin, Mingmin, Cao, Shengkai, Wang, Qi, Li, Gongli, Xiao, Xi, Gao, Honggang, Liu, Haiou, Li
Published in Journal of semiconductors (01.02.2016)
Published in Journal of semiconductors (01.02.2016)
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