Investigations of photo-assisted conductive atomic force microscopy on III-nitrides
Chang, Mao-Nan, Lin, Ruo-Syuan, Liu, Hsueh-Hsing, Lin, Hung-Min, Lin, Hung-Cheng, Chyi, Jen-Inn
Published in Microelectronics (01.02.2009)
Published in Microelectronics (01.02.2009)
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