by Lin, Dave Y.-W., Wen, Charles H.-P.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.04.2020)

by Lin, Dave Y.-W., Wen, Charles H.-P.
Published in IEEE transactions on computers (01.05.2022)

by Huang, Gary K.-C., Lin, Dave Y.-W., Tang, John Z.-L, Wen, Charles H.-P.
Published in 2020 IEEE 29th Asian Test Symposium (ATS) (23.11.2020)

by Tang, John Z.-L, Lin, Dave Y.-W., Yee, Ralf E.-H., Wen, Charles H.-P.
Published in 2021 IEEE International Test Conference in Asia (ITC-Asia) (18.08.2021)