Design of an offset-tolerant voltage sense amplifier bit-line sensing circuit for SRAM memories
Licciardo, G.D, Cappetta, C, Di Benedetto, L, Rubino, A
Published in Electronics letters (04.08.2016)
Published in Electronics letters (04.08.2016)
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Journal Article
An Analog Circuit for Accurate OCVD Measurements
Bellone, S., Licciardo, G.D.
Published in IEEE transactions on instrumentation and measurement (01.06.2008)
Published in IEEE transactions on instrumentation and measurement (01.06.2008)
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Journal Article
An Analytical Model of an OCVD-Based Measurement Technique of the Local Carrier Lifetime
Bellone, S., Licciardo, G.D., Guerriero, G., Rubino, A.
Published in IEEE transactions on electron devices (01.11.2007)
Published in IEEE transactions on electron devices (01.11.2007)
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Journal Article
Low Power Tiny Binary Neural Network with improved accuracy in Human Recognition Systems
Vita, Antonio De, Pau, Danilo, Benedetto, Luigi Di, Rubino, Alfredo, Petrot, Frederic, Licciardo, Gian Domenico
Published in 2020 23rd Euromicro Conference on Digital System Design (DSD) (01.08.2020)
Published in 2020 23rd Euromicro Conference on Digital System Design (DSD) (01.08.2020)
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Conference Proceeding
Limitations of the Open-Circuit Voltage Decay technique applied to 4H-SiC diodes
Bellone, S., Albanese, L.F., Licciardo, G.D.
Published in 2009 International Semiconductor Conference (01.10.2009)
Published in 2009 International Semiconductor Conference (01.10.2009)
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Conference Proceeding
Physical model, measurement setup and experiments of a measurement technique of the carrier lifetime profile in power devices
Bellone, S., Licciardo, G.D., Rubino, A., Petrosino, M.
Published in 2007 International Workshop on Physics of Semiconductor Devices (01.12.2007)
Published in 2007 International Workshop on Physics of Semiconductor Devices (01.12.2007)
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Conference Proceeding
The effect of ITO surface energy on OLED electrical properties
Petrosino, M., Vacca, P., Licciardo, G.D., Rubino, A., Bellone, S.
Published in 2007 International Workshop on Physics of Semiconductor Devices (01.12.2007)
Published in 2007 International Workshop on Physics of Semiconductor Devices (01.12.2007)
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Conference Proceeding
A novel measurement method of the spatial carrier lifetime profile based on the OCVD technique
Bellone, S., Licciardo, G.D., Neitzert, H.C.
Published in Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) (2004)
Published in Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) (2004)
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Conference Proceeding