Machine Learning Algorithms for Detecting Fake Reviews - A Study
Shanmugha Priya, R. K., Murugeswari, K, Biju, J., Libin Jacob, P., Anbarasan, R., B V, Santhosh Krishna
Published in 2023 IEEE International Conference on ICT in Business Industry & Government (ICTBIG) (08.12.2023)
Published in 2023 IEEE International Conference on ICT in Business Industry & Government (ICTBIG) (08.12.2023)
Get full text
Conference Proceeding