by Venkatraman, R., Castagnetti, R., Kobozeva, O., Duan, F.L., Kamath, A., Sabbagh, S.T., Vilchis-Cruz, M.A., Liaw, J.J., Jyh-Cheng You, Ramesh, S.
Published in IEEE transactions on electron devices (01.02.2005)

by Chang, Chih-Hao, Chang, V.S., Pan, K.H., Lai, K.T., Lu, J. H., Ng, J.A., Chen, C.Y., Wu, B.F., Lin, C.J., Liang, C.S., Tsao, C.P., Mor, Y.S., Li, C.T., Lin, T.C., Hsieh, C.H., Chen, P.N., Hsu, H.H., Chen, J.H., Chen, H.F., Yeh, J.Y., Chiang, M.C., Lin, C.Y., Liaw, J.J., Wang, C.H., Lee, S.B., Chen, C.C., Lin, H.J., Chen, R., Chen, K.W., Chui, C.O., Yeo, Y.C., Huang, K.B., Lee, T.L., Tsai, M.H., Chen, K.S., Lu, Y.C., Jang, S.M., Wu, S.-Y.
Published in 2022 International Electron Devices Meeting (IEDM) (01.01.2022)

by Diaz, C.H., Goto, K., Huang, H.T., Yasuda, Yu, Tsao, C.P., Chu, T.T., Lu, W.T., Chang, V., Hou, Y.T., Chao, Y.S., Hsu, P.F., Chen, C.L., Lin, K.C., Ng, J.A., Yang, W.C., Chen, C.H., Peng, Y.H., Chen, C.J., Chen, C.C., Yu, M.H., Yeh, L.Y., You, K.S., Chen, K.S., Thei, K.B., Lee, C.H., Yang, S.H., Cheng, J.Y., Huang, K.T., Liaw, J.J., Ku, Y., Jang, S.M., Chuang, H., Liang, M.S.
Published in 2008 IEEE International Electron Devices Meeting (01.12.2008)

by Wu, Shien-Yang, Liaw, J.J., Lin, C.Y., Chiang, M.C., Yang, C.K., Cheng, J.Y., Tsai, M.H., Liu, M.Y., Wu, P.H., Chang, C.H., Hu, L.C., Lin, C.I., Chen, H.F., Chang, S.Y., Wang, S.H., Tong, P.Y., Hsieh, Y.L., Pan, K.H., Hsieh, C.H., Chen, C.H., Yao, C.H., Chen, C.C., Lee, T.L., Chang, C.W., Lin, H.J., Chen, S.C., Shieh, J.H., Tsai, M.H., Jang, S.M., Chen, K.S., Ku, Y., See, Y.C, Lo, W.J.
Published in 2009 Symposium on VLSI Technology (01.06.2009)

by Wu, Shien-Yang, Chang, C.H., Chiang, M.C., Lin, C.Y., Liaw, J.J., Cheng, J.Y., Yeh, J.Y., Chen, H.F., Chang, S.Y., Lai, K.T., Liang, M.S., Pan, K.H., Chen, J.H., Chang, V.S., Luo, T.C., Wang, X., Mor, Y.S., Lin, C.I., Wang, S.H., Hsieh, M.Y., Chen, C.Y., Wu, B.F., Lin, C.J., Liang, C.S., Tsao, C.P., Li, C.T., Chen, C.H., Hsieh, C.H., Liu, H.H., Chen, P.N., Chen, C.C., Chen, R., Yeo, Y.C., Chui, C.O., Chang, W., Lee, T.L., Huang, K.B., Lin, H.J., Chen, K.W., Tsai, M.H., Chen, K.S., Chen, X.M., Cheng, Y.K., Wang, C.H., Shue, W., Ku, Y., Jang, S. M., Cao, M., Lu, L.C., Chang, T.S.
Published in 2022 International Electron Devices Meeting (IEDM) (03.12.2022)

by JUANG, L.C., LUO, C.H., LIAW, J.J., LIN, M.I., LEE, Y.S.
Published in Journal of aerosol science (01.07.2004)

by Czerwiec, F.S., Liaw, J.J., Liu, S.-B., Perez-Stable, C., Grumbles, R., Howard, G.A., Roos, B.A., Burnstein, K.L.
Published in Bone (New York, N.Y.) (01.07.1997)

by Hsieh, S., Tsui, R.F., Lin, W., Liaw, J.J., Doong, K.Y., Wu, C.-M.M.
Published in Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) (2004)

by Shien-Yang Wu, Chou, C.W., Lin, C.Y., Chiang, M.C., Yang, C.K., Liu, M.Y., Hu, L.C., Chang, C.H., Wu, P.H., Chen, H.F., Chang, S.Y., Wang, S.H., Tong, P.Y., Hsieh, Y.L., Liaw, J.J., Pan, K.H., Hsieh, C.H., Chen, C.H., Cheng, J.Y., Yao, C.H., Wan, W.K., Lee, T.L., Huang, K.T., Lin, K.C., Yeh, L.Y., Ku, K.C., Chen, S.C., Lin, H.J., Jang, S.M., Lu, Y.C., Shieh, J.H., Tsai, M.H., Song, J.Y., Chen, K.S., Chang, V., Cheng, S.M., Yang, S.H., Diaz, C.H., See, Y.C., Liang, M.S.
Published in 2007 IEEE International Electron Devices Meeting (01.12.2007)

by Wu, C.C., Diaz, C.H., Lin, B.L., Chang, S.Z., Wang, C.C., Liaw, J.J., Wang, C.H., Young, K.K., Lee, K.H., Liew, B.K., Sun, J.Y.C.
Published in International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) (1999)

by Chang, C.S., Chao, C.P., Leung, Y.K., Lin, C.H., Hsu, H.-M., Wang, Y.P., Chang, S.Y., Chiu, T.H., Shyu, J.S., Wu, C.C., Wang, C.H., Chang, R.Y., Chen, C.W., Huang, C.F., Chen, C.H., Chen, S.H., Yeh, T.H., Cheng, J.Y., Liaw, J.J., Chu, Y.L., Ong, T.C., Yu, M.C., Yu, C.H., Lin, H.J., Tao, H.J., Liang, M.S., See, Y.C., Diaz, C.H., Sun, Y.C.
Published in 2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303) (2002)

by Diaz, C.H., Young, K.L., Hsu, J.H., Lin, J.C.H., Hou, C.S., Lin, C.T., Liaw, J.J., Wu, C.C., Su, C.W., Wang, C.H., Ting, J.K., Yang, S.S., Lee, K.Y., Wu, S.Y., Tsai, C.C., Tao, H.J., Jang, S.M., Shue, S.L., Hsieh, H.C., Wang, Y.Y., Chen, C.C., Yang, S.C., Fu, S., Chang, S.Z., Lo, T.C., Wu, J.Y., Shy, J.S., Liu, C.W., Chen, S.H., Lin, B.L., Liew, B.K., Yen, T., Yu, C.H., Chao, Y.C., Liang, M.S., Wang, C., Sun, J.Y.C.
Published in 1999 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.99CH36325) (1999)