Therapeutic Peptide RF16 Derived from CXCL8 Inhibits MDA-MB-231 Cell Invasion and Metastasis
Chang, Chun-Ming, Chang, Chun-Chun, Lam, Ho Yin Pekkle, Peng, Shih-Yi, Lai, Yi-Hsuan, Hsiang, Bi-Da, Liao, Yu-Yi, Hsu, Hao-Jen, Jiang, Shinn-Jong
Published in International journal of molecular sciences (01.09.2023)
Published in International journal of molecular sciences (01.09.2023)
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Journal Article
[CH3NH3]4Ga4SbS9S0.28O0.72H: A Three‐Dimensionally Open‐Framework Heterometallic Chalcogenidoantimonate Exhibiting Ni2+ Ion‐Exchange Property
Zhang, Bo, Li, Wei‐An, Liao, Yi‐Yu, Zhang, Chen, Feng, Mei‐Ling, Huang, Xiao‐Ying
Published in Chemistry, an Asian journal (16.03.2018)
Published in Chemistry, an Asian journal (16.03.2018)
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Journal Article
Using Cogenerative Dialogues to Transform Contradictions in Project-Based Learning
Hsu, Pei-Ling, Liao, Yi-Yu
Published in Eurasia Journal of Mathematics, Science and Technology Education (01.12.2018)
Published in Eurasia Journal of Mathematics, Science and Technology Education (01.12.2018)
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Journal Article
Layout-Aware Multiple Scan Tree Synthesis for 3-D SoCs
Li, Katherine Shu-Min, Yi-Yu Liao
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.12.2012)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.12.2012)
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Journal Article
IEEE 1500 Compatible Multilevel Maximal Concurrent Interconnect Test
Li, Katherine Shu-Min, Yi-Yu Liao
Published in IEEE transactions on very large scale integration (VLSI) systems (01.07.2013)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.07.2013)
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Journal Article
Hidden Wafer Scratch Defects Projection for Diagnosis and Quality Enhancement
Li, Katherine Shu-Min, Liao, Peter Yi-Yu, Cheng, Ken Chau-Cheung, Chen, Leon Li-Yang, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Chou, Leon, Han, Gus Chang-Hung, Chen, Jwu E., Liang, Hsin-Chung, Hsu, Chung-Lung
Published in IEEE transactions on semiconductor manufacturing (01.02.2021)
Published in IEEE transactions on semiconductor manufacturing (01.02.2021)
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Journal Article
TestDNA-E: Wafer Defect Signature for Pattern Recognition by Ensemble Learning
Li, Katherine Shu-Min, Chen, Leon Li-Yang, Cheng, Ken Chau-Cheung, Liao, Peter Yi-Yu, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Chou, Leon, Tsai, Nova Cheng-Yen, Lee, Chen-Shiun
Published in IEEE transactions on semiconductor manufacturing (01.05.2022)
Published in IEEE transactions on semiconductor manufacturing (01.05.2022)
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Journal Article
TestDNA: Novel Wafer Defect Signature for Diagnosis and Pattern Recognition
Li, Katherine Shu-Min, Tsai, Nova Cheng-Yen, Cheng, Ken Chau-Cheung, Jiang, Xu-Hao, Liao, Peter Yi-Yu, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Chou, Leon, Lee, Chen-Shiun
Published in IEEE transactions on semiconductor manufacturing (01.08.2020)
Published in IEEE transactions on semiconductor manufacturing (01.08.2020)
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Journal Article
Wafer Scratch Pattern Reconstruction for High Diagnosis Accuracy and Yield Optimization
Li, Katherine Shu-Min, Chen, Leon Li-Yang, Liao, Peter Yi-Yu, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Chou, Leon, Tsai, Nova Cheng-Yeh, Cheng, Ken Chau-Cheung, Han, Gus Chang-Hung, Lee, Chen-Shiun, Chen, Jwu E., Liang, Hsing-Chung, Hsu, Chung-Lung
Published in IEEE transactions on semiconductor manufacturing (01.05.2022)
Published in IEEE transactions on semiconductor manufacturing (01.05.2022)
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Journal Article
Synthesizing Crystalline Chalcogenidoarsenates in Thiol–Amine Solvent Mixtures
Wang, Fei, Yang, Dan-Dan, Liao, Yi-Yu, Ma, Zhong-Jie, Hu, Bing, Wang, Yan-Qi, Xiong, Wei-Wei, Huang, Xiao-Ying
Published in Inorganic chemistry (17.02.2020)
Published in Inorganic chemistry (17.02.2020)
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Journal Article
Selective Capture of Ba2+, Ni2+, and Co2+ by a Robust Layered Metal Sulfide
Gao, Yu-Jie, Sun, Hai-Yan, Li, Ji-Long, Qi, Xing-Hui, Du, Ke-Zhao, Liao, Yi-Yu, Huang, Xiao-Ying, Feng, Mei-Ling, Kanatzidis, Mercouri G
Published in Chemistry of materials (10.03.2020)
Published in Chemistry of materials (10.03.2020)
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Journal Article
Association Between VDR Polymorphisms and Breast Cancer: An Updated and Comparative Meta-analysis of Crude and Adjusted Odd Ratios
Huang, Qian-Qian, Liao, Yu-Yi, Ye, Xiao-Hua, Fu, Jin-Jian, Chen, Si-Dong
Published in Asian Pacific journal of cancer prevention : APJCP (2014)
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Published in Asian Pacific journal of cancer prevention : APJCP (2014)
Journal Article
IEEE 1500 Compatible Interconnect Test with Maximal Test Concurrency
Li, K.S.-M., Yi-Yu Liao, Yuo-Wen Liu, Jr-Yang Huang
Published in 2009 Asian Test Symposium (01.11.2009)
Published in 2009 Asian Test Symposium (01.11.2009)
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Conference Proceeding
Association between VDR polymorphisms and breast cancer: an updated and comparative meta-analysis of crude and adjusted odd ratios
Huang, Qian-Qian, Liao, Yu-Yi, Ye, Xiao-Hua, Fu, Jin-Jian, Chen, Si-Dong
Published in Asian Pacific journal of cancer prevention : APJCP (01.01.2014)
Published in Asian Pacific journal of cancer prevention : APJCP (01.01.2014)
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Journal Article
Degradation of turbid images based on the adaptive logarithmic algorithm
Liao, Yu-Yi, Tai, Shen-Chuan, Lin, Jzau-Sheng, Liu, Ping-Jui
Published in Computers & mathematics with applications (1987) (01.09.2012)
Published in Computers & mathematics with applications (1987) (01.09.2012)
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Journal Article
Modified histogram equalization based on the partitioned dynamic range
Shen-Chuan Tai, Chia-Ying Chang, Yi-Shan Lin, Yu-Yi Liao
Published in 2014 IEEE International Conference on Consumer Electronics - Taiwan (01.05.2014)
Published in 2014 IEEE International Conference on Consumer Electronics - Taiwan (01.05.2014)
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Conference Proceeding
Early Termination for Residual Quadtree Decision-Making in HEVC
Tai, Shen-Chuan, Chang, Chia-Ying, Chen, Bo-Jhih, Liao, Yu-Yi, Wu, Yung-Gi
Published in International journal of computers & applications (01.01.2014)
Published in International journal of computers & applications (01.01.2014)
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Journal Article
Wafer Defect Pattern Classification with Explainable-Decision Tree Technique
Cheng, Ken Chau-Cheung, Li, Katherine Shu-Min, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Lee, Chen-Shiun, Chen, Leon Li-Yang, Liao, Peter Yi-Yu, Tsai, Nova Cheng-Yen
Published in 2022 IEEE International Test Conference (ITC) (01.09.2022)
Published in 2022 IEEE International Test Conference (ITC) (01.09.2022)
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Conference Proceeding