Composition Segregation of Ge-Rich GST and Its Effect on Reliability
Lee, Yung-Huei, Liao, P.J., Hou, Vincent, Heh, Dawei, Nien, Chih-Hung, Kuo, Wen-Hsien, Chen, Gary T., Yu, Shao-Ming, Chen, Yu-Sheng, Wu, Jau-Yi, Bao, Xinyu, Diaz, Carlos H.
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
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Conference Proceeding
Mesenchymal stem cell as salvage treatment for refractory chronic GVHD
Weng, J Y, Du, X, Geng, S X, Peng, Y W, Wang, Z, Lu, Z S, Wu, S J, Luo, C W, Guo, R, Ling, W, Deng, C X, Liao, P J, Xiang, A P
Published in Bone marrow transplantation (Basingstoke) (01.12.2010)
Published in Bone marrow transplantation (Basingstoke) (01.12.2010)
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Journal Article
Characterization of Fatigue and Its Recovery Behavior in Ferroelectric HfZrO
Liao, P.J., Chang, Y.K., Lee, Y.-H., Lin, Y.M., Yeong, S.H., Hwang, R.L., Hou, V., Nien, C.H., Lu, R., Lin, C.T.
Published in 2021 Symposium on VLSI Technology (13.06.2021)
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Published in 2021 Symposium on VLSI Technology (13.06.2021)
Conference Proceeding
Investigation of Defect Engineering Toward Prolonged Endurance for HfZrO Based Ferroelectric Device
Lee, J.H., Chou, C.H., Liao, P.J., Chang, Y.K., Huang, H.H., Lin, T.Y., Liu, Y.S., Nien, C.H., Hou, D.H., Hou, T.H., He, Jun
Published in 2022 International Electron Devices Meeting (IEDM) (03.12.2022)
Published in 2022 International Electron Devices Meeting (IEDM) (03.12.2022)
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Conference Proceeding
A new on-state drain-bias TDDB lifetime model and HCI effect on drain-bias TDDB of ultra thin oxide
Liao, P.J., Chia Lin Chen, Young, J.W., Tsai, Y.S., Wang, C.J., Wu, K.
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
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Conference Proceeding
Drain biased TDDB lifetime model for ultra thin gate oxide
Chin-Yuan Ko, Tsai, Y.S., Liao, P.J., Wang, J.J., Oates, A., Wu, K.
Published in 2004 IEEE International Reliability Physics Symposium. Proceedings (2004)
Published in 2004 IEEE International Reliability Physics Symposium. Proceedings (2004)
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Conference Proceeding
Gate oxide multiple soft breakdown (Multi-SBD) impact on CMOS inverter
Huey-Ming Huang, Ko, C.Y., Yang, M.L., Liao, P.J., Wang, J.J., Oates, A., Wu, K.
Published in 2004 IEEE International Reliability Physics Symposium. Proceedings (2004)
Published in 2004 IEEE International Reliability Physics Symposium. Proceedings (2004)
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Conference Proceeding
Thermal conductivity and softening of gate oxide breakdown
Chin-Yuan Ko, Liao, P.J., Shih, J.R., Wang, J.J., Peng, Y.K., Yue, J.
Published in 7th International Symposium on Plasma- and Process-Induced Damage (2002)
Published in 7th International Symposium on Plasma- and Process-Induced Damage (2002)
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