by Chiou, Lih-Yih, Huang, Jing-Yu, Li, Chi-Kuan, Tsai, Chen-Chung
Published in 2021 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) (19.04.2021)

by Denko, Mieso K, Tsao, Shiao-Li, Shih, Chi-sheng, Shih, Chi-Sheng, Li, Kuan-Ching, Zeng, Qing-An, Park, Soo-Hyun, Ko, Young-Bae, Hung, Shih-Hao, Park, Jong Hyuk
Year of Publication 2007