Response inhibition in a subclinical obsessive-compulsive sample
Abramovitch, Amitai, Shaham, Noa, Levin, Lior, Bar-Hen, Moran, Schweiger, Avraham
Published in Journal of behavior therapy and experimental psychiatry (01.03.2015)
Published in Journal of behavior therapy and experimental psychiatry (01.03.2015)
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Journal Article
In-line material analysis of 50nm defects by integration of Energy (EDX) and Wavelength (WDX) Dispersive X-ray analysis
Levin, Lior, Eilon, Michal, Porat, Ronnie, van der Sijs, Arjan, Stegen, Raf, van Brederode, Erik
Published in 2008 International Symposium on Semiconductor Manufacturing (ISSM) (01.10.2008)
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Published in 2008 International Symposium on Semiconductor Manufacturing (ISSM) (01.10.2008)
Conference Proceeding
A digital single-wire multiswitch (DSWM) channel-stacking IC in 45nm CMOS for satellite outdoor units
Weinan Gao, Huff, B., Hess, K., Coulibaly, D., Pala, C., Jiang Cao, Bhatia, J., Waltari, M., Levin, L., Cathelin, C., Nouvet, T., Nidhi, N., Kodkani, R., Maeda, R., Costa, D., McFee, J., Moazzam, R., Vincent, H., Durieux, P.
Published in 2013 IEEE International Solid-State Circuits Conference Digest of Technical Papers (01.02.2013)
Published in 2013 IEEE International Solid-State Circuits Conference Digest of Technical Papers (01.02.2013)
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Conference Proceeding
SEM-based methodology for root cause analysis of wafer edge and bevel defects
Porat, R., Dotan, K., Hemar, S., Levin, L., Li, K., Sung, G.
Published in 2008 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (01.05.2008)
Published in 2008 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (01.05.2008)
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Conference Proceeding