Characterization of alterations on power MOSFET devices under extreme electro-thermal fatigue
Martineau, D., Mazeaud, T., Legros, M., Dupuy, Ph, Levade, C.
Published in Microelectronics and reliability (01.09.2010)
Published in Microelectronics and reliability (01.09.2010)
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Conference Proceeding
Characterization of ageing failures on power MOSFET devices by electron and ion microscopies
Martineau, D., Mazeaud, T., Legros, M., Dupuy, Ph, Levade, C., Vanderschaeve, G.
Published in Microelectronics and reliability (01.09.2009)
Published in Microelectronics and reliability (01.09.2009)
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Conference Proceeding
Characterization and modelling of ageing failures on power MOSFET devices
Khong, B., Legros, M., Tounsi, P., Dupuy, Ph, Chauffleur, X., Levade, C., Vanderschaeve, G., Scheid, E.
Published in Microelectronics and reliability (01.09.2007)
Published in Microelectronics and reliability (01.09.2007)
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Conference Proceeding
TEM in situ study of degradation mechanisms induced by temperature annealing and electron beam irradiation in a ZnSe/GaAs heterostructure
Lavagne, S., Levade, C., Vanderschaeve, G.
Published in Materials science & engineering. B, Solid-state materials for advanced technology (15.03.2006)
Published in Materials science & engineering. B, Solid-state materials for advanced technology (15.03.2006)
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Dislocation mobility and electronic effects in semiconductor compounds
Vanderschaeve, G., Levade, C., Caillard, D.
Published in Journal of microscopy (Oxford) (01.07.2001)
Published in Journal of microscopy (Oxford) (01.07.2001)
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Alterations induced in the structure of intelligent power devices by extreme electro-thermal fatigue
Khong, B., Legros, M., Dupuy, P., Levade, C., Vanderschaeve, G.
Published in Physica status solidi. C (01.07.2007)
Published in Physica status solidi. C (01.07.2007)
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misfit dislocations in ZnSe/GaAs(001) heterostructure
LAVAGNE, S, LEVADE, C, VANDERSCHAEVE, G
Published in Journal of physics. Condensed matter (Print) (16.12.2002)
Published in Journal of physics. Condensed matter (Print) (16.12.2002)
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Conference Proceeding
Transmission electron microscopy in situ investigation of dislocation mobility in semiconductors
Vanderschaeve, G, Levade, C, Caillard, D
Published in Journal of physics. Condensed matter (11.12.2000)
Published in Journal of physics. Condensed matter (11.12.2000)
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Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue
Khong, B., Tounsi, P., Dupuy, Ph, Chauffleur, X., Legros, M, Deram, A., Levade, C., Vanderschaeve, G., Dorkel, J.-M., Fradin, J.-P.
Published in Microelectronics and reliability (01.09.2005)
Published in Microelectronics and reliability (01.09.2005)
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Conference Proceeding
Photoplastic effect and Vickers microhardness in III–V and II–VI semiconductor compounds
Koubaiti, S., Couderc, J.J., Levade, C., Vanderschaeve, G.
Published in Materials science & engineering. A, Structural materials : properties, microstructure and processing (30.08.1997)
Published in Materials science & engineering. A, Structural materials : properties, microstructure and processing (30.08.1997)
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A TEM study of slip lines in power MOS devices
Rivière-Jérôme, A, Levade, C, Vanderschaeve, G, Percheron-Garçon, I, Forgerit, B
Published in Journal of physics. Condensed matter (11.12.2000)
Published in Journal of physics. Condensed matter (11.12.2000)
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Journal Article
Transmission electron microscopy study of crystal defects in ZnSe/GaAs(001) epilayers
Lavagne, S, Levade, C, Vanderschaeve, G, Crestou, J, Tournié, E, Faurie, J P
Published in Journal of physics. Condensed matter (11.12.2000)
Published in Journal of physics. Condensed matter (11.12.2000)
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Journal Article
Photoplastic effect and vickers microhardness in ZnS sphalerite
KOUBAÏTI, S, COUDERC, J. J, LEVADE, C, VANDERSCHAEVE, G
Published in Scripta materialia (15.03.1996)
Published in Scripta materialia (15.03.1996)
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Protoplastic effect and vickers microhardness in ZnS sphalerite
Koubaïti, S., Couderc, J.J., Levade, C., Vanderschaeve, G.
Published in Scripta materialia (01.03.1996)
Published in Scripta materialia (01.03.1996)
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TEM in-situ observation of recombination-enhanced mobility of dislocations in II–VI compounds
Levade, C., Couderc, J.J., Vanderschaeve, G., Caillard, D., Couret, A.
Published in Applied surface science (02.06.1991)
Published in Applied surface science (02.06.1991)
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Conference Proceeding
310 misfit dislocations in ZnSe/GaAs(001) heterostructure
Lavagne, S, Levade, C, Vanderschaeve, G
Published in Journal of physics. Condensed matter (09.12.2002)
Published in Journal of physics. Condensed matter (09.12.2002)
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