Oxygen-related defects in n-type Czochralski silicon wafers studied by hyperspectral photoluminescence imaging
Mehl, Torbjørn, Burud, Ingunn, Letty, Elénore, Olsen, Espen
Published in Energy procedia (01.09.2017)
Published in Energy procedia (01.09.2017)
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Journal Article
Identification of Lifetime-limiting Defects in As-received and Heat Treated Seed-end Czochralski Wafers
Letty, Elénore, Veirman, Jordi, Favre, Wilfried, Lemiti, Mustapha
Published in Energy procedia (01.08.2016)
Published in Energy procedia (01.08.2016)
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Journal Article
Method for determining the thermal donor concentration of a semiconductor sample
Mehl, Torbjørn, Burud, Ingunn, Letty, Elénore, Veirman, Jordi, Kvalbein, Lisa, Olsen, Espen, Favre, Wilfried
Year of Publication 02.04.2024
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Year of Publication 02.04.2024
Patent
METHOD FOR DETERMINING THE THERMAL DONOR CONCENTRATION OF A SEMICONDUCTOR SAMPLE
MEHL, Torbjørn, KVALBEIN, Lisa, FAVRE, Wilfried, OLSEN, Espen, LETTY, Elénore, VEIRMAN, Jordi, BURUD, Ingunn
Year of Publication 02.11.2022
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Year of Publication 02.11.2022
Patent
METHOD FOR DETERMINING THE THERMAL DONOR CONCENTRATION OF A SEMICONDUCTOR SAMPLE
MEHL, Torbjørn, KVALBEIN, Lisa, FAVRE, Wilfried, OLSEN, Espen, LETTY, Elénore, VEIRMAN, Jordi, BURUD, Ingunn
Year of Publication 17.02.2022
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Year of Publication 17.02.2022
Patent
METHOD FOR DETERMINING THE THERMAL DONOR CONCENTRATION OF A SEMICONDUCTOR SAMPLE
MEHL, Torbjørn, KVALBEIN, Lisa, FAVRE, Wilfried, OLSEN, Espen, LETTY, Elénore, VEIRMAN, Jordi, BURUD, Ingunn
Year of Publication 19.03.2020
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Year of Publication 19.03.2020
Patent
METHOD FOR DETERMINING THE THERMAL DONOR CONCENTRATION OF A SEMICONDUCTOR SAMPLE
MEHL, Torbjørn, KVALBEIN, Lisa, FAVRE, Wilfried, OLSEN, Espen, LETTY, Elénore, VEIRMAN, Jordi, BURUD, Ingunn
Year of Publication 18.03.2020
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Year of Publication 18.03.2020
Patent