Electrocardiogram pattern recognition by means of MLP network and PCA: a case study on equal amount of input signal types
Vargas, F., Lettnin, D., de Castro, M.C.F., Macarthy, M.
Published in VII Brazilian Symposium on Neural Networks, 2002. SBRN 2002. Proceedings (2002)
Published in VII Brazilian Symposium on Neural Networks, 2002. SBRN 2002. Proceedings (2002)
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Conference Proceeding
A new learning approach to design fault tolerant ANNs: finally a zero HW-SW overhead
Vargas, F., Lettnin, D., Brum, D., Prestes, D.
Published in Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02) (2002)
Published in Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02) (2002)
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Conference Proceeding
Scalable hybrid verification for embedded software
Behrend, Jörg, Lettnin, D, Heckeler, P, Ruf, J, Kropf, T, Rosenstiel, W
Published in 2011 Design, Automation & Test in Europe (01.03.2011)
Published in 2011 Design, Automation & Test in Europe (01.03.2011)
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Conference Proceeding
Hybrid verificatio of temporal properties in hardware dependent software
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Conference Proceeding
Verification of Temporal Properties in Automotive Embedded Software
Lettnin, D., Nalla, P.K., Ruf, J., Kropf, T., Rosenstiel, W., Kirsten, T., Schonknecht, V., Reitemeyer, S.
Published in 2008 Design, Automation and Test in Europe (01.03.2008)
Published in 2008 Design, Automation and Test in Europe (01.03.2008)
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Conference Proceeding
Semiformal verification of temporal properties in automotive hardware dependent software
Lettnin, D., Nalla, P.K., Behrend, J., Ruf, J., Gerlach, J., Kropf, T., Rosenstiel, W., Schonknecht, V., Reitemeyer, S.
Published in 2009 Design, Automation & Test in Europe Conference & Exhibition (01.04.2009)
Published in 2009 Design, Automation & Test in Europe Conference & Exhibition (01.04.2009)
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Conference Proceeding
Coverage Driven Verification applied to Embedded Software
Lettnin, D., Winterholer, M., Braun, A., Gerlach, J., Ruf, J., Kropf, T., Rosenstiel, W.
Published in IEEE Computer Society Annual Symposium on VLSI (ISVLSI '07) (01.03.2007)
Published in IEEE Computer Society Annual Symposium on VLSI (ISVLSI '07) (01.03.2007)
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Conference Proceeding