by Cazarré, A., Lépinois, F., Marty, A., Pinel, S., Tasselli, J., Bailbé, J.P., Morante, J.R., Murray, F.
Published in Microelectronics and reliability (2003)

by Lepinois, F., Pinel, S., Cazarre, A., Tasselli, J., Marty, A., Bailbe, J.-P., Morante, J.R., Murray, F., Gonnard, O.
Published in 2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595) (2002)