by Leontowich, A F G, Berg, R, Regier, C N, Taylor, D M, Wang, J, Beauregard, D, Geilhufe, J, Swirsky, J, Wu, J, Karunakaran, C, Hitchcock, A P, Urquhart, S G
Published in Review of scientific instruments (01.09.2018)

by Bai, Y., Nasr, P., King, G., Reid, J. W., Leontowich, A. F. G., Corradini, M. G., Weiss, R. G., Auzanneau, F.-I., Rogers, M. A.
Published in Nanoscale (02.11.2023)

by Prasciolu, M., Leontowich, A. F. G., Krzywinski, J., Andrejczuk, A., Chapman, H. N., Bajt, S.
Published in Optical materials express (01.04.2015)

by Geilhufe, J., Leontowich, A. F. G., Wang, J., Berg, R., Regier, C. N., Taylor, D. M., Beauregard, D., Swirsky, J., Karunakaran, C., Hitchcock, A. P., Urquhart, S. G.
Published in Microscopy and microanalysis (01.08.2018)

by Leontowich, A F G, Taylor, D M, Wang, J, Regier, C N, Regier, T Z, Berg, R, Beauregard, D, Dynes, J J, Senger, C, Swirsky, J, Karunakaran, C, Hitchcock, A P, Urquhart, S G
Published in Journal of physics. Conference series (01.06.2017)

by Bai, Y, Nasr, P, King, G, Reid, J. W, Leontowich, A. F. G, Corradini, M. G, Weiss, R. G, Auzanneau, F.-I, Rogers, M. A
Published in Nanoscale (02.11.2023)