Combining adaptive alternate test and multi-site
Leger, Gildas
Published in 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2015)
Published in 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2015)
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Conference Proceeding
Nonintrusive Machine Learning-Based Yield Recovery and Performance Recentering for mm-Wave Power Amplifiers: A Two-Stage Class-A Power Amplifier Case Study
Cilici, Florent, Margalef-Rovira, Marc, Lauga-Larroze, Estelle, Bourdel, Sylvain, Leger, Gildas, Vincent, Loic, Mir, Salvador, Barragan, Manuel J.
Published in IEEE transactions on microwave theory and techniques (01.05.2024)
Published in IEEE transactions on microwave theory and techniques (01.05.2024)
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Journal Article
A Nonintrusive Machine Learning-Based Test Methodology for Millimeter-Wave Integrated Circuits
Cilici, Florent, Barragan, Manuel J., Lauga-Larroze, Estelle, Bourdel, Sylvain, Leger, Gildas, Vincent, Loic, Mir, Salvador
Published in IEEE transactions on microwave theory and techniques (01.08.2020)
Published in IEEE transactions on microwave theory and techniques (01.08.2020)
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Journal Article
Mixed-signal test automation: Are we there yet?
Leger, Gildas, Barragan, Manuel J.
Published in 2018 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2018)
Published in 2018 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2018)
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Conference Proceeding
Sigma-delta testability for pipeline A/D converters
Gines, Antonio, Leger, Gildas
Published in 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2014)
Published in 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2014)
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Conference Proceeding
Feature selection for Alternate Test using wrappers: Application to an RF LNA case study
Barragan, Manuel J., Leger, Gildas
Published in 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2015)
Published in 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2015)
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Conference Proceeding
Yield Recovery of mm-Wave Power Amplifiers using Variable Decoupling Cells and One-Shot Statistical Calibration
Cilici, Florent, Barragan, Manuel J., Mir, Salvador, Lauga-Larroze, Estelle, Bourdel, Sylvain, Leger, Gildas
Published in 2019 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2019)
Published in 2019 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2019)
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Conference Proceeding
On the importance of bias-dependent charge injection for SET evaluation in AMS Circuits
Gutierrez, Valentin, Leger, Gildas
Published in 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS) (01.06.2020)
Published in 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS) (01.06.2020)
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Conference Proceeding
SET sensitivity evaluation, a comparison before and after layout
Gutierrez, Valentin, Leger, Gildas
Published in 2019 XXXIV Conference on Design of Circuits and Integrated Systems (DCIS) (01.11.2019)
Published in 2019 XXXIV Conference on Design of Circuits and Integrated Systems (DCIS) (01.11.2019)
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Conference Proceeding
A tissue impedance measurement chip for myocardial ischemia detection
Yufera, A., Rueda, A., Munoz, J.M., Doldan, R., Leger, G., Rodriguez-Villegas, E.O.
Published in IEEE transactions on circuits and systems. I, Regular papers (01.12.2005)
Published in IEEE transactions on circuits and systems. I, Regular papers (01.12.2005)
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Journal Article
1 Adaptive defect simulation flow for Defect-oriented Test evaluation
Gutierrez, Valentin, Leger, Gildas
Published in 2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) (01.07.2019)
Published in 2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) (01.07.2019)
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Conference Proceeding
Single Event Transient injection in large mixed-signal circuits
Gutierrez, Valentin, Leger, Gildas
Published in 2018 Conference on Design of Circuits and Integrated Systems (DCIS) (01.11.2018)
Published in 2018 Conference on Design of Circuits and Integrated Systems (DCIS) (01.11.2018)
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Conference Proceeding