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Acher, Olivier, Nguyên, Thanh-Liêm, Podzorov, Alexander, Leroy, Matthieu, Carles, Pierre-Alix, Legendre, Sébastien
Published in Measurement science & technology (01.04.2021)
Published in Measurement science & technology (01.04.2021)
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Accelerating the development of phase‐change random access memory with in‐fab plasma profiling time‐of‐flight mass spectrometry
Nolot, Emmanuel, Mazel, Yann, Barnes, Jean‐Paul, Sabbione, Chiara, Navarro, Gabriele, Tempez, Agnes, Legendre, Sébastien
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Published in Surface and interface analysis (01.12.2020)
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Published in Optical materials express (01.12.2015)
Published in Optical materials express (01.12.2015)
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An electronic signature of hydrolysation in the X-ray absorption spectrum of aqueous formaldehyde
Ottosson, Niklas, Aziz, Emad F., Bradeanu, Ioana L., Legendre, Sébastien, Öhrwall, Gunnar, Svensson, Svante, Björneholm, Olle, Eberhardt, Wolfgang
Published in Chemical physics letters (2008)
Published in Chemical physics letters (2008)
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Assessing the insulating properties of an ultrathin SrTiO3 shell grown around GaAs nanowires with molecular beam epitaxy
Peric, N, Dursap, T, Becdelievre, J, Berthe, M, Addad, A, Romeo, P Rojo, Bachelet, R, Saint-Girons, G, Lancry, O, Legendre, S, Biadala, L, Penuelas, J, Grandidier, B
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Published in Nanotechnology (10.09.2022)
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Transport Properties of Methyl-Terminated Germanane Microcrystallites
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Published in Nanomaterials (Basel, Switzerland) (29.03.2022)
Published in Nanomaterials (Basel, Switzerland) (29.03.2022)
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Plasmon single- and multi-quantum excitation in free metal clusters as seen by photoelectron spectroscopy
Andersson, T, Zhang, C, Rosso, A, Bradeanu, I, Legendre, S, Canton, S E, Tchaplyguine, M, Öhrwall, G, Sorensen, S L, Svensson, S, Mårtensson, N, Björneholm, O
Published in The Journal of chemical physics (07.03.2011)
Published in The Journal of chemical physics (07.03.2011)
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Journal Article
Rapid, semi-quantitative depth profiling of ultra-thin films using plasma profiling time-of-flight mass spectrometry: AM: Advanced metrology
Mazel, Yann, Barnes, Jean-Paul, Nolot, Emmanuel, Tempez, Agnes, Legendre, Sebastien
Published in 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2017)
Published in 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2017)
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Conference Proceeding
Auger Electron Spectroscopy as a Probe of the Solution of Aqueous Ions
Pokapanich, Wandared, Bergersen, Henrik, Bradeanu, Ioana L, Marinho, Ricardo R. T, Lindblad, Andreas, Legendre, Sebastien, Rosso, Aldana, Svensson, Svante, Tchaplyguine, Maxim, Kryzhevoi, Nikolai V, Cederbaum, Lorenz S
Published in Journal of the American Chemical Society (03.06.2009)
Published in Journal of the American Chemical Society (03.06.2009)
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Nolot, Emmanuel, Mazel, Yann, Barnes, Jean‐Paul, Sabbione, Chiara, Navarro, Gabriele, Tempez, Agnes, Legendre, Sébastien
Published in Surface and interface analysis (01.12.2020)
Published in Surface and interface analysis (01.12.2020)
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Journal Article
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Nolot, Emmanuel, Mazel, Yann, Barnes, Jean‐Paul, Sabbione, Chiara, Navarro, Gabriele, Tempez, Agnes, Legendre, Sébastien
Published in Surface and interface analysis (01.12.2020)
Published in Surface and interface analysis (01.12.2020)
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Journal Article
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Nolot, Emmanuel, Mazel, Yann, Jean‐Paul Barnes, Sabbione, Chiara, Navarro, Gabriele, Tempez, Agnes, Legendre, Sébastien
Published in Surface and interface analysis (01.12.2020)
Published in Surface and interface analysis (01.12.2020)
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