XPS XRF - - -FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS AND XRF TECHNOLOGIES
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Year of Publication 14.04.2022
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Silicon-Germanium (SiGe) composition and thickness determination via simultaneous smallspot XPS and XRF measurements
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Published in 25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2014) (01.05.2014)
Published in 25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2014) (01.05.2014)
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Conference Proceeding
XPS XRF - - -FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS AND XRF TECHNOLOGIES
KLARE MARK, LEE WEI TI, POIS HEATH A, KWAN MICHAEL C, LARSON CHARLES THOMAS, BOT LAWRENCE V
Year of Publication 02.03.2017
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Year of Publication 02.03.2017
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Year of Publication 05.09.2018
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CHEMICAL VAPOR DEPOSITION (CVD) OF RUTHENIUM FILMS AND APPLICATIONS FOR SAME
YU, SANG HO, LEE WEI TI, GANGULI SESHADRI, LEE, SANG HYEOB, KIM, HOON, HA, HYOUNG CHAN
Year of Publication 02.09.2014
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Year of Publication 02.09.2014
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METAL GATE STRUCTURES AND METHODS FOR FORMING THEREOF
YU, SANG HO, MORAES KEVIN, TANG XIANMIN, GANGULI SESHADRI, LEE WEI TI, LEI YU, LEE, SANG HYEOB, KIM, HOON, GANDIKOTA SRINIVAS, HA, HYOUNG CHAN
Year of Publication 06.08.2013
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Year of Publication 06.08.2013
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Resistive switching memory having confined filament formation and methods thereof
Gan, Wee Chen, Vasquez, Jr., Natividad, Narayanan, Sundar, Lee, Wei Ti
Year of Publication 28.05.2024
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Year of Publication 28.05.2024
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Characterizing and measuring in small boxes using XPS with multiple measurements
Pois, Heath, Lund, Parker, Singh, Saurabh, Kislitsyn, Dmitry, Warad, Laxmi, Tseng, Benny, Lee, Wei Ti, Chen, James
Year of Publication 21.05.2024
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Year of Publication 21.05.2024
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