Photolithography run-to-run metrology control using multiple algorithms for mass production enhancement
Yung-Yao Lee, Han-Wei Chu, Chia-Jen Tung, Pei-Wei Lin, Jin-Shing Luo
Published in 2008 International Symposium on Semiconductor Manufacturing (ISSM) (01.10.2008)
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Published in 2008 International Symposium on Semiconductor Manufacturing (ISSM) (01.10.2008)
Conference Proceeding
An integrated photolithography system framework for automatic manufacturing in mass production 300mm Fab
Yung-Yao Lee, Cheng-Fa Lin, Pi-Min Hsu, Kai-Wen Lo, Mei-Fang Hsu, Shih-Liang Hsieh
Published in 2007 International Symposium on Semiconductor Manufacturing (01.10.2007)
Published in 2007 International Symposium on Semiconductor Manufacturing (01.10.2007)
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Conference Proceeding