Current-Voltage Modeling of DRAM Cell Transistor Using Genetic Algorithm and Deep Learning
Park, Jun Hui, Kim, Jung Nam, Lee, Seonhaeng, Kim, Gang-Jun, Lee, Namhyun, Baek, Rock-Hyun, Kim, Dae Hwan, Kim, Changhyun, Kang, Myounggon, Kim, Yoon
Published in IEEE access (2024)
Published in IEEE access (2024)
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Journal Article
Program Pulse Control for Program Efficiency and Disturbance of 3D-NAND Flash Using Novel Machine Learning-Based Pareto Optimization
Nam, Kihoon, Kim, Donghyun, Yun, Hyeok, Park, Chanyang, Jang, Hyundong, Cho, Kyeongrae, Eom, Seungjoon, Kim, Jiyoon, Lee, Seonhaeng, Lee, Namhyun, Kim, Gang-Jun, Baek, Rock-Hyun
Published in IEEE transactions on electron devices (01.11.2024)
Published in IEEE transactions on electron devices (01.11.2024)
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Journal Article
Impact Ionization and Hot-Carrier Degradation in Saddle-Fin and Buried-Gate Transistor of Dynamic Random Access Memory at Cryogenic Temperature
Park, Jun, Lee, Namhyun, Kim, Gang-Jun, Choi, Hyun-Seok, Kim, Dae Hwan, Kim, Changhyun, Kang, Myounggon, Kim, Yoon
Published in IEEE electron device letters (01.05.2021)
Published in IEEE electron device letters (01.05.2021)
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Journal Article
Fowler-Nordheim Stress-Induced Degradation of Buried-Channel-Array Transistors in DRAM Cell for Cryogenic Memory Applications
Choi, Sungju, Yang, Ga Won, Lee, Sangwon, Park, Jingyu, Kim, Changwook, Park, Jun, Choi, Hyun-Seok, Lee, Namhyun, Kim, Gang-Jun, Kim, Yoon, Kang, Myounggon, Kim, Changhyun, Bae, Jong-Ho, Kim, Dae Hwan
Published in IEEE transactions on electron devices (01.01.2023)
Published in IEEE transactions on electron devices (01.01.2023)
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Journal Article
INTEGRATED CIRCUIT ELEMENT
SONG SEUNGMIN, CHA SEUNGMIN, LEE NAMHYUN, YOU SORA, KIM JINKYU, KIM YOUNGWOO, LEE SUNGMOON
Year of Publication 15.02.2024
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Year of Publication 15.02.2024
Patent
Effect of OFF-state stress on reliability of nMOSFET in SWD circuits of DRAM
Kim, Jongkyun, Lee, Namhyun, Kim, Gang-Jun, Lee, Young-Yun, Seok, Jungeun, Lee, Yunsung
Published in Microelectronics and reliability (01.09.2018)
Published in Microelectronics and reliability (01.09.2018)
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Journal Article
The Characterization of Degradation on various SiON pMOSFET transistors under AC/DC NBTI stress
Kim, Gang-Jun, Yoon, Moonjee, Kim, SungHwan, Eo, Myeongkyu, Kim, Shinhyung, You, Taehun, Lee, Namhyun, Kim, Kijin, Pae, Sangwoo
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
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Conference Proceeding
Effect of reverse body bias on hot-electron-induced punchthrough reliability of pMOSFETs with thin gate dielectric at high temperatures
Kang, YongHa, Kim, JongKyun, Lee, NamHyun, Oh, MinGeon, Hwang, YuChul, Moon, ByungMoo
Published in Japanese Journal of Applied Physics (01.06.2016)
Published in Japanese Journal of Applied Physics (01.06.2016)
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Journal Article
SEMICONDUCTOR DEVICE
Jeon, Jaeho, Hwang, Donghoon, Lee, Namhyun, Ryu, Taehyun, PARK, Wooseok
Year of Publication 26.09.2024
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Year of Publication 26.09.2024
Patent
Forward Body Bias Technique in DRAM Peripheral Transistor at Cryogenic Temperature for Quantum Computing Applications
You, Hyunseo, An, Jehyun, Nam, Kihoon, Kang, Bohyeon, Park, Jongseo, Lee, Namhyun, Lee, Seonhaeng, Baek, Rock-Hyun
Published in 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (07.03.2023)
Published in 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (07.03.2023)
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Conference Proceeding