2^ Pattern Run-Length for Test Data Compression
Lee, Lung-Jen, Tseng, Wang-Dauh, Lin, Rung-Bin, Chang, Cheng-Ho
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.04.2012)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.04.2012)
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Journal Article
Reduction of power dissipation during scan testing by test vector ordering
Tseng, Wang-Dauh, Lee, Lung-Jen, Lin, Rung-Bin
Published in Journal of the Chinese Institute of Engineers (01.03.2010)
Published in Journal of the Chinese Institute of Engineers (01.03.2010)
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Journal Article
A Multi-dimensional Pattern Run-Length Method for Test Data Compression
Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin, Chen-Lun Lee
Published in 2009 Asian Test Symposium (01.11.2009)
Published in 2009 Asian Test Symposium (01.11.2009)
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Conference Proceeding
Deterministic Built-In Self-Test Using Multiple Linear Feedback Shift Registers for Low-Power Scan Testing
Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin, Chi-Wei Yu
Published in 2009 Asian Test Symposium (01.11.2009)
Published in 2009 Asian Test Symposium (01.11.2009)
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Conference Proceeding
A hybrid method for segmented test data compression
Lee, Lung-Jen, Tseng, Wang-Dauh, Liu, Yi-Yu
Published in Journal of the Chinese Institute of Engineers (17.02.2015)
Published in Journal of the Chinese Institute of Engineers (17.02.2015)
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Journal Article
Reduction of test data volume and test application time by scan chain disabling technique
Lee, Lung-Jen, Tseng, Wang-Dauh, Lin, Rung-Bin
Published in Journal of the Chinese Institute of Engineers (01.09.2012)
Published in Journal of the Chinese Institute of Engineers (01.09.2012)
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Journal Article
Mismatch address indexing for test data compression
Lee, Lung-Jen, Tseng, Wang-Dauh, Lin, Rung-Bin
Published in Journal of the Chinese Institute of Engineers (01.12.2011)
Published in Journal of the Chinese Institute of Engineers (01.12.2011)
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Journal Article
Deterministic ATPG for Low Capture Power Testing
Lung-Jen Lee, Chia-Cheng He, Wang-Dauh Tseng
Published in 2012 13th International Workshop on Microprocessor Test and Verification (MTV) (01.12.2012)
Published in 2012 13th International Workshop on Microprocessor Test and Verification (MTV) (01.12.2012)
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Conference Proceeding
Dual-LFSR Reseeding for Low Power Testing
Lung-Jen Lee, Wang-Dauh Tseng, Wen-Ting Yang
Published in 2012 13th International Workshop on Microprocessor Test and Verification (MTV) (01.12.2012)
Published in 2012 13th International Workshop on Microprocessor Test and Verification (MTV) (01.12.2012)
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Conference Proceeding
Two-Way Multicasting for Test Data Compression
Lung-Jen Lee, Wang-Dauh Tseng, Wei-Shun Chen
Published in 2012 13th International Workshop on Microprocessor Test and Verification (MTV) (01.12.2012)
Published in 2012 13th International Workshop on Microprocessor Test and Verification (MTV) (01.12.2012)
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Conference Proceeding
Reduction of Power Dissipation during Scan Testing by Test Vector Ordering
Wang-Dauh Tseng, Lung-Jen Lee
Published in 2007 Eighth International Workshop on Microprocessor Test and Verification (01.12.2007)
Published in 2007 Eighth International Workshop on Microprocessor Test and Verification (01.12.2007)
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Conference Proceeding
A Low-Complexity Color Image Compression Algorithm Based on AMBTC
Cheng, Hsiao-Hsuan, Chen, Chiung-An, Lee, Lung-Jen, Lin, Ting-Lan, Chiou, Yih-Shyh, Chen, Shih-Lun
Published in 2019 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-TW) (01.05.2019)
Published in 2019 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-TW) (01.05.2019)
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Conference Proceeding
Cascaded broadcasting for test data compression
Cheng-Ho Chang, Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin
Published in 2010 International Computer Symposium (ICS2010) (01.12.2010)
Published in 2010 International Computer Symposium (ICS2010) (01.12.2010)
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Conference Proceeding
2n Pattern run-length for test data compression
Cheng-Ho Chang, Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin
Published in 2010 International Computer Symposium (ICS2010) (01.12.2010)
Published in 2010 International Computer Symposium (ICS2010) (01.12.2010)
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Conference Proceeding