Generation of a dark hollow beam by a small hollow fiber
Yin, Jianping, Noh, Heung-Ryoul, Lee, Kwan-Il, Kim, Ki-Hyun, Wang, Yu-Zhu, Jhe, Wonho
Published in Optics communications (01.06.1997)
Published in Optics communications (01.06.1997)
Get full text
Journal Article
MANUFACTURING METHOD OF DEFECT-FREE FERROELECTRIC THIN FILM USING LATTICE STRAIN CONTROL
KIM JONGBUM, JEON YOUNG UK, KIM BOGYU, KANG JOONHYUN, KIM GEUNPIL, LEE KWAN IL
Year of Publication 03.07.2023
Get full text
Year of Publication 03.07.2023
Patent
BRILLOUIN DISTRIBUTED OPTICAL FIBER SENSOR CAPABLING OF MEASURING LONG MEASURING DISTANCE
LEE SANG BAE, KIM JONGBUM, RYU GUKBEEN, KIM IN SOO, JEONG WOOKJIN, LEE WONSUK, LEE KWAN IL
Year of Publication 31.05.2022
Get full text
Year of Publication 31.05.2022
Patent
THIN FILM DEPOSITION APPARATUS MOUNTABLE WITH ANALYSIS SYSTEM
WONSUK LEE, KANG JIN GU, IN SOO KIM, GUMIN KANG, JOONHYUN KANG, KIM CHUN KEUN, LEE KWAN IL
Year of Publication 29.03.2021
Get full text
Year of Publication 29.03.2021
Patent
PEROVSKITE HAVING MULTILAYER STRUCTURE AND MANUFACTURING METHOD THEREOF
HYEJUN KIM, KIM YOUNG HWAN, BYUNG HYUN NAM, IN SOO KIM, KIM CHUN KEUN, LEE KWAN IL
Year of Publication 12.03.2021
Get full text
Year of Publication 12.03.2021
Patent
DEVICE FOR DETERMINING COMPLEXITY OF MATERIAL AND METHOD FOR DETERMINING COMPLEXITY OF MATERIAL
KANG JIN GU, HAN IL KI, JAEHYUN PARK, S. JOON KWON, JOONHYUN KANG, GUMIN KANG, PARK JAE GWAN, HYUNGDUK KO, LEE KWAN IL
Year of Publication 29.06.2021
Get full text
Year of Publication 29.06.2021
Patent
METHOD FOR DETERMINING LESION BASED ON MEDICAL IMAGE
KANG JIN GU, HAN IL KI, JAEHYUN PARK, S. JOON KWON, JOONHYUN KANG, GUMIN KANG, PARK JAE GWAN, HYUNGDUK KO, LEE KWAN IL
Year of Publication 09.06.2021
Get full text
Year of Publication 09.06.2021
Patent
DEVICE FOR DETERMINING COMPLEXITY OF SYSTEM AND METHOD FOR DETERMINING COMPLEXITY OF SYSTEM
KANG JIN GU, HAN IL KI, JAEHYUN PARK, S. JOON KWON, JOONHYUN KANG, GUMIN KANG, PARK JAE GWAN, HYUNGDUK KO, LEE KWAN IL
Year of Publication 08.06.2021
Get full text
Year of Publication 08.06.2021
Patent
Method for quantitative measurement of defects within block-copolymer thin-flim having lamellar pattern
KANG JIN GU, HAN IL KI, S. JOON KWON, GUMIN KANG, JOONHYUN KANG, PARK JAE GWAN, HYUNGDUK KO, LEE KWAN IL
Year of Publication 28.05.2020
Get full text
Year of Publication 28.05.2020
Patent
Method for quantitative measurement of defects within block-copolymer thin-flim having lamellar pattern
KANG JIN GU, HAN IL KI, S. JOON KWON, GUMIN KANG, JOONHYUN KANG, PARK JAE GWAN, HYUNGDUK KO, LEE KWAN IL
Year of Publication 28.05.2020
Get full text
Year of Publication 28.05.2020
Patent
Method for quantitative measurement of defects within block-copolymer thin-flim having lamellar pattern
KANG JIN GU, HAN IL KI, S. JOON KWON, GUMIN KANG, JOONHYUN KANG, PARK JAE GWAN, HYUNGDUK KO, LEE KWAN IL
Year of Publication 28.05.2020
Get full text
Year of Publication 28.05.2020
Patent