by Na, Ki R., Kim, Yoo H., Chung, Hyo K., Yeo, Min‐Kyung, Ham, Young R., Jeong, Jin Y., Kim, Koon S., Lee, Kang W., Choi, Dae E.
Published in Internal medicine journal (01.12.2017)

by Lee, K.W.
Published in IEEE transactions on reliability (01.03.2000)

by Lee, Kang Woo, Burm, Jin Sik, Yang, Won Yong
Published in International wound journal (01.04.2013)

by Lee, Kang W., Suh, Jae J., Lee, Hun
Published in Microelectronics and reliability (1988)

by LEE KANG W
Year of Publication 16.02.2006

by KANG W. LEE
Year of Publication 16.10.2000

by LEE; KANG W
Year of Publication 28.04.1998

by LEE KANG W, SUH YOUNGHO, KIM HYUN
Year of Publication 07.07.2005

by LEE; KANG W
Year of Publication 02.05.1995

by Archibald, James L, Lee, Kang W, Holder, Jr, Clinton H, Muth, Edwin A, Ulery, Kreg D
Year of Publication 14.12.2010

by Lee, K.W.
Published in IEEE transactions on electron devices (01.03.1986)

by Holder, Jr, Clinton H, Lee, Kang W, Simko, Joseph E, Smooha, Yehuda, Zhu, Ying
Year of Publication 01.12.2009

by HOLDER, JR. CLINTON H, LEE KANG W, SMOOHA YEHUDA, SIMKO JOSEPH E, ZHU YING
Year of Publication 01.12.2009

by ULERY KREG D, HOLDER, JR. CLINTON H, LEE KANG W, ARCHIBALD JAMES L, MUTH EDWIN A
Year of Publication 14.12.2010

by BIRRU HEMANTH K, HOLDER, JR. CLINTON H, LEE KANG W
Year of Publication 25.06.2009

by Archibald, James L, Holder, Jr, Clinton H, Lee, Kang W, Muth, Edwin A, Ulery, Kreg D
Year of Publication 31.03.2009

by Lee, K.W., Tillman, F.A., Higgins, J.J.
Published in IEEE transactions on reliability (01.04.1988)

by ULERY KREG D, LEE KANG W, HOLDER CLINTON H, ARCHIBALD JAMES L, MUTH EDWIN A
Year of Publication 23.10.2008

by Lee, Kang W., Hong, Jung S.
Published in Microelectronics and reliability (1991)

by LEE KANG W, SMOOHA YEHUDA, SIMKO JOSEPH E, HOLDER CLINTON H, ZHU YING
Year of Publication 19.06.2008