Influence of Skin Effect on the Current Distribution of Grounded-Gate NMOS Device
Jian-Hsing Lee, Iyer, Natarajan Mahadeva, Haojun Zhang
Published in IEEE electron device letters (01.11.2017)
Published in IEEE electron device letters (01.11.2017)
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Journal Article
ESD Robust Fully Salicided 5-V Integrated Power MOSFET in Submicron CMOS
Jian-Hsing Lee, Iyer, Natarajan Mahadeva, Prabhu, Manjunatha
Published in IEEE electron device letters (01.05.2017)
Published in IEEE electron device letters (01.05.2017)
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Journal Article
A New Low-Voltage Triggering SCR for the Protection of a Double RESURF HV-LDMOS
Wu, Cheng-Hsu, Lee, Jian-Hsing, Lien, Chen-Hsin
Published in IEEE electron device letters (01.09.2016)
Published in IEEE electron device letters (01.09.2016)
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Journal Article
A Novel Drain Design for ESD Improvement of UHV-LDMOS
Wu, Cheng-Hsu, Lee, Jian-Hsing, Lien, Chenhsin
Published in IEEE transactions on electron devices (01.12.2015)
Published in IEEE transactions on electron devices (01.12.2015)
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Journal Article
Engineering ESD Robust LDMOS SCR Devices in FinFET Technology
Lee, Jian-Hsing, Prabhu, Manjunatha, Natarajan, Mahadeva Iyer
Published in IEEE electron device letters (01.07.2018)
Published in IEEE electron device letters (01.07.2018)
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Journal Article
A Concise Electrothermal Model to Characterize the Thermal Safe-Operating Area of Power Transistor
Lee, Jian-Hsing, Lin, Gong-Kai, Chen, Chun-Chih, Chen, Li-Fan, Wang, Chien-Wei, Huang, Shao-Chang, Li, Ching-Ho, Liao, Chih-Cherng, Chuang, Jung-Tsun, Chen, Ke-Horng
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
Simple scheme to increase hold voltage for silicon-controlled rectifier
Hung, Chung-Yu, Kao, Tzu-Cheng, Lee, Jian-Hsing, Gong, Jeng, Huang, Tsung-Yi, Su, Hung-Der, Chang, Kuo-Cheng, Huang, Chih-Fang, Lo, Kuo-Hsuan
Published in Electronics letters (30.01.2014)
Published in Electronics letters (30.01.2014)
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Journal Article
Printed-circuit board (PCB) charge induced product yield-loss during the final test
Jian-Hsing Lee, Takahashi, Kunihiko, Prabhu, Manjunatha, Natarajan, Mahadeva Iyer
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
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Conference Proceeding
Failure mechanism of E-FUSE for a production chip during the ESD zapping event
Linewih, Handoko, Jian-Hsing Lee, Marimuthu, Sevashanmugam, Tze-Ho Chan
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
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Conference Proceeding
Failure mechanism for input buffer under CDM test
Kao, Tzu-Cheng, Hung, Chung-Yu, Lee, Jian-Hsing, Lien, Chen-Hsin, Chiu, Chien-Wei, Lo, Kuo-Hsuan, Su, Hung-Der, Weng, Wu-Te
Published in Electronics letters (24.04.2014)
Published in Electronics letters (24.04.2014)
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Journal Article
Semiself-Protection Scheme for Gigahertz High-Frequency Output ESD Protection
LEE, Jian-Hsing, HUANG, Shao-Chang, SU, Hung-Der, CHEN, Ke-Horng
Published in IEEE transactions on electron devices (01.07.2011)
Published in IEEE transactions on electron devices (01.07.2011)
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Journal Article
A high-performance Slow-Wave CPW with ESD protection for ultraflat band millimeter-Wave applications
Wei Gao, Linewih, Handoko, Suh-Fei Lim, Jian-Hsing Lee, Sern-Ee Leang
Published in 2017 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) (01.06.2017)
Published in 2017 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) (01.06.2017)
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Conference Proceeding
Failure mechanism of high-voltage isolated lateral diffused NMOS under high-current events
Cheng-Hsu Wu, Chen-Hsin Lien, Jian-Hsing Lee
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
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Conference Proceeding
The Transition Behavior of Power LDNMOS at the ON-OFF Transient During Unclamped Inductive-Switching (UIS) Test
Lee, Jian-Hsing, Liao, Chih-Cherng, Lin, Gong-Kai, Nidhi, Karuna, Chuang, Chieh-Yao, Huang, Shao-Chang, Chen, Ke-Horng
Published in IEEE transactions on electron devices (01.07.2024)
Published in IEEE transactions on electron devices (01.07.2024)
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Journal Article