by Dong Wook Kim, Lee, J K Jerry, Myung-June Lee, Pai, S Y, Chen, Stan, Kuo, Frank
Published in 2010 Proceedings 60th Electronic Components and Technology Conference (ECTC) (01.06.2010)

by Lee, J. K. Jerry, Haggag, Amr
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)

by Lee, J. K. Jerry, Haggag, Amr, Eklow, William
Published in 2014 International Test Conference (01.10.2014)

by Haggag, A., Sumikawa, N., Shaukat, A., Lee, J. K. Jerry, Aghel, Nick, Slayman, Charlie
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)

by Haggag, Amr, Phillips, Michael, Lee, J. K. Jerry
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)

by Lee, J. K. J., Pai, S. Y., Chang, K. P., Hsu, N., Juan, A., Su, K. C.
Published in 2011 IEEE International Integrated Reliability Workshop Final Report (01.10.2011)

by Pai, S.Y., Lee, J.K.J., Ng, K., Hsiao, R., Su, K.C., Chou, E.N.
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)

by Chia, Ray W.J, Wang, Charles C, Lee, Jerry J.K
Published in Journal of magnetism and magnetic materials (01.02.2000)

by Tian, Hong, Lee, Jerry J.K.
Published in Journal of magnetism and magnetic materials (01.03.1996)

by Chia, Ray WJ, Tang, Wing T, Lee, Jerry JK
Published in Tribology letters (01.01.1998)