Relationship between Detrapping of Electrons and Negative Gate Bias during Recovery Process in a‐InGaZnO Thin Film Transistors
Kang, Yun‐Seong, Lee, Yeol‐Hyeong, Kim, Woo‐Sic, Cho, Yong‐Jung, Park, JeongKi, Kim, GeonTae, Kim, Ohyun
Published in Physica status solidi. A, Applications and materials science (20.02.2019)
Published in Physica status solidi. A, Applications and materials science (20.02.2019)
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Effect of illumination on the hump phenomenon in I–V characteristics of amorphous InGaZnO TFTs under positive gate‐bias stress
Cho, Yong‐Jung, Lee, Yeol‐Hyeong, Kim, Woo‐Sic, Kim, Byeong‐Koo, Park, Kyung Tae, Kim, Ohyun
Published in Physica status solidi. A, Applications and materials science (01.05.2017)
Published in Physica status solidi. A, Applications and materials science (01.05.2017)
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Journal Article
Effect of Wavelength and Intensity of Light on a-InGaZnO TFTs under Negative Bias Illumination Stress
Kim, Woo-Sic, Lee, Yeol-Hyeong, Cho, Yong-Jung, Kim, Byeong-Koo, Park, Kyung Tae, Kim, Ohyun
Published in ECS journal of solid state science and technology (01.01.2017)
Published in ECS journal of solid state science and technology (01.01.2017)
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Journal Article
Degradation process by effect of water molecules during negative bias temperature stress in amorphous-InGaZnO thin-film transistor
Lee, Yeol-Hyeong, Cho, Yong-Jung, Kim, Woo-Sic, Park, Jeong Ki, Kim, Geon Tae, Kim, Ohyun
Published in Japanese Journal of Applied Physics (01.10.2017)
Published in Japanese Journal of Applied Physics (01.10.2017)
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Effect of defect creation and migration on hump characteristics of a-InGaZnO thin film transistors under long-term drain bias stress with light illumination
Cho, Yong-Jung, Kim, Woo-Sic, Lee, Yeol-Hyeong, Park, Jeong Ki, Kim, Geon Tae, Kim, Ohyun
Published in Solid-state electronics (01.06.2018)
Published in Solid-state electronics (01.06.2018)
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Abnormal behavior with hump characteristics in current stressed a-InGaZnO thin film transistors
Kim, Woo-Sic, Cho, Yong-Jung, Lee, Yeol-Hyeong, Park, JeongKi, Kim, GeonTae, Kim, Ohyun
Published in Solid-state electronics (01.11.2017)
Published in Solid-state electronics (01.11.2017)
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Mechanism of Hump Phenomenon in the I-V Characteristics of Amorphous in-Ga-Zn-O Thin Film Transistors Under Positive Bias and Illumination Stress
Cho, Yong-Jung, Lee, Yeol-hyeong, Kim, Woo-Sic, Kim, Byeong-Koo, Park, Kyung Tae, Kim, Ohyun
Published in Meeting abstracts (Electrochemical Society) (01.04.2016)
Published in Meeting abstracts (Electrochemical Society) (01.04.2016)
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Journal Article
Effect of Light Intensity and Wavelength on a-Ingazno Thin Film Transistors Under Negative Bias Illumination Stress
Kim, Woo-Sic, Lee, Yeol-hyeong, Cho, Yong-Jung, Kim, Byeong-Koo, Park, Kyung Tae, Kim, Ohyun
Published in Meeting abstracts (Electrochemical Society) (01.04.2016)
Published in Meeting abstracts (Electrochemical Society) (01.04.2016)
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The Gene Expression of Human Foamy Virus Does Not Require a Post-transcriptional Transactivator
Lee, Ann Hwee, Lee, Hyeong Yeol, Sung, Young Chul
Published in Virology (New York, N.Y.) (01.10.1994)
Published in Virology (New York, N.Y.) (01.10.1994)
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