An Effective Test and Diagnosis Algorithm for Dual‐Port Memories
Park, Youngkyu, Yang, Myung‐Hoon, Kim, Yongjoon, Lee, Dae‐Yeal, Kang, Sungho
Published in ETRI journal (01.08.2008)
Published in ETRI journal (01.08.2008)
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Journal Article
An Effective Test and Diagnosis Algorithm for Dual-Port Memories
Park, Young-Kyu, Yang, Myung-Hoon, Kim, Yong-Joon, Lee, Dae-Yeal, Kang, Sung-Ho
Published in ETRI journal (04.02.2008)
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Published in ETRI journal (04.02.2008)
Journal Article
An Effective Test Pattern Generation for Testing Signal Integrity
Yongjoon Kim, Myung-Hoon Yang, Youngkyu Park, DaeYeal Lee, Sungho Kang
Published in 2006 15th Asian Test Symposium (01.11.2006)
Published in 2006 15th Asian Test Symposium (01.11.2006)
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