Layout-induced stress effects on the performance and variation of FinFETs
Lee, Choongmok, Kang, Hyun-Chul, Min, Jeong Guk, Kim, Jongchol, Kwon, Uihui, Lee, Keun-Ho, Park, Youngkwan
Published in 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2015)
Published in 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2015)
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