Real-Time Human Activity Recognition with IMU and Encoder Sensors in Wearable Exoskeleton Robot via Deep Learning Networks
Jaramillo, Ismael Espinoza, Jeong, Jin Gyun, Lopez, Patricio Rivera, Lee, Choong-Ho, Kang, Do-Yeon, Ha, Tae-Jun, Oh, Ji-Heon, Jung, Hwanseok, Lee, Jin Hyuk, Lee, Won Hee, Kim, Tae-Seong
Published in Sensors (Basel, Switzerland) (10.12.2022)
Published in Sensors (Basel, Switzerland) (10.12.2022)
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An Electrical Inline-Testable Structure to Monitor Gate-Source/Drain Short Defect Caused by Imperfect Fin-Cut Patterning in FinFET Technology
Zhu, Hai, Onishi, Katsunori, Wu, Stephen, Yang, Adam, Jeong, Byoung-Wook, Lim, Seong-Joon, Jing, Nan, Lee, Choong-Ho, Conrady, David, Chidambarrao, Dureseti
Published in 2023 35th International Conference on Microelectronic Test Structure (ICMTS) (27.03.2023)
Published in 2023 35th International Conference on Microelectronic Test Structure (ICMTS) (27.03.2023)
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Conference Proceeding
Quasi 3-D Velocity Saturation Model for Multiple-Gate MOSFETs
HAN, Jin-Woo, LEE, Choong-Ho, PARK, Donggun, CHOI, Yang-Kyu
Published in IEEE transactions on electron devices (01.05.2007)
Published in IEEE transactions on electron devices (01.05.2007)
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A study of negative-bias temperature instability of SOI and body-tied FinFETs
LEE, Hyunjin, LEE, Choong-Ho, PARK, Donggun, CHOI, Yang-Kyu
Published in IEEE electron device letters (01.05.2005)
Published in IEEE electron device letters (01.05.2005)
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Journal Article
Parasitic S/D resistance effects on hot-carrier reliability in body-tied FinFETs
HAN, Jin-Woo, LEE, Choong-Ho, PARK, Donggun, CHOI, Yang-Kyu
Published in IEEE electron device letters (01.06.2006)
Published in IEEE electron device letters (01.06.2006)
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Journal Article
Fully integrated SONOS flash memory cell array with BT (body tied)-FinFET structure
Sung, Suk-Kang, Kim, Tae-Yong, Cho, Eun Suk, Cho, Hye Jin, Choi, Byung Yong, Oh, Chang Woo, Cho, Byung-Kyu, Lee, Choong-Ho, Park, Donggun
Published in IEEE transactions on nanotechnology (01.05.2006)
Published in IEEE transactions on nanotechnology (01.05.2006)
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Journal Article
Conference Proceeding
Statistical retention modeling in floating-gate cell: ONO scaling
Serov, A., Dongwan Shin, Dae Sin Kim, Taikyung Kim, Keun-Ho Lee, Young-Kwan Park, Moon-Hyun Yoo, Taehun Kim, Sug-Kang Sung, Choong-Ho Lee
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
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Conference Proceeding
Neuroprotective effect of forsythiaside against transient cerebral global ischemia in gerbil
Kim, Jong Min, Kim, Sunho, Kim, Dong Hyun, Lee, Choong Ho, Park, Se Jin, Jung, Ji Wook, Ko, Kwang Ho, Cheong, Jae Hoon, Lee, Seung Ho, Ryu, Jong Hoon
Published in European journal of pharmacology (25.06.2011)
Published in European journal of pharmacology (25.06.2011)
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Journal Article
A comprehensive modeling of dynamic negative-bias temperature instability in PMOS body-tied FinFETs
LEE, Hyunjin, LEE, Choong-Ho, PARK, Donggun, CHOI, Yang-Kyu
Published in IEEE electron device letters (01.04.2006)
Published in IEEE electron device letters (01.04.2006)
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Journal Article
Hot Carrier Reliability Study in Body-Tied Fin-Type Field Effect Transistors
Han, Jin-Woo, Lee, Choong-Ho, Park, Donggun, Choi, Yang-Kyu
Published in Japanese Journal of Applied Physics (01.04.2006)
Published in Japanese Journal of Applied Physics (01.04.2006)
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Journal Article
Expression of heat shock protein 60 kDa is upregulated in cervical cancer
Hwang, You Jin, Lee, Soon Pyo, Kim, Suk Young, Choi, Young Hwan, Kim, Min Ji, Lee, Choong Ho, Lee, Joo Young, Kim, Dae Young
Published in Yonsei medical journal (30.06.2009)
Published in Yonsei medical journal (30.06.2009)
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