by Kalter, H.L., Coppens, P.D., Ellis, W.F., Fifield, J.A., Kokoszka, D.J., Leasure, T.L., Miller, C.P., Nguyen, Q., Papritz, R.E., Patton, C.S., Poplawski, J.M., Tomashot, S.W., van der Hoeven, W.B.
Published in IEEE journal of solid-state circuits (01.10.1985)