A high-performance Slow-Wave CPW with ESD protection for ultraflat band millimeter-Wave applications
Wei Gao, Linewih, Handoko, Suh-Fei Lim, Jian-Hsing Lee, Sern-Ee Leang
Published in 2017 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) (01.06.2017)
Published in 2017 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) (01.06.2017)
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Conference Proceeding
Analysis and Modeling for Reverse Body Bias Stress Impact on HCI Induced Degradation in n-Type EDMOS
Cai, Miao, Leang, Sern Ee, Wai Chew, Kok, Tan, Pee Ya, Herlambang, Aloysius P., Zhu, Chunxiang, Guo, Yongxin
Published in 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (18.07.2022)
Published in 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (18.07.2022)
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Conference Proceeding
Statistical SPICE analysis of a 0.18 /spl mu/m CMOS digital/analog technology during process development
Rankin, N.S., Chun Ng, Leang Sern Ee, Boyland, F., Quek, E., Leung Ying Keung, Walton, A.J., Redford, M.
Published in ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) (2001)
Published in ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) (2001)
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Conference Proceeding