C60 Secondary Ion FT-ICR Mass Spectrometry: High Mass Resolving Power and High Mass Accuracy SIMS
Pasa-Tolic, L., Smith, D.F., Leach, F.E., Robinson, E.W., Heeren, R.M.
Published in Microscopy and microanalysis (01.08.2013)
Published in Microscopy and microanalysis (01.08.2013)
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